Search NASA⌕ Search

SEARCH · Search NASA

Results for “Surface analysis”

Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

Quote a phrase for an exact phrase match. Source license links do not imply unrestricted reuse.

At least 19 records
All sourcesNASA NTRSDOE OSTI
NASA NTRS1988

Applications of surface analysis and surface theory in tribology

Tribology, the study of adhesion, friction and wear of materials is a complex field which requires a knowledge of solid state physics, surface physics, chemistry, material science and mechanical engineering. It has been dominated, however, by the more practical need to make equipment work. With the advent of surface analysis and advances in surface and solid state theory, a new dimension has been added to the analysis of interactions at tribological interfaces. In this paper the applications of tribological studies and their limitations are presented. Examples from research at the NASA Lewis Research Center are given. Emphasis is on fundamental studies involving the effects of monolayer coverage and thick films on friction and wear. A summary of the current status of theoretical calculations of defect energetics is presented. In addition, some new theoretical techniques which enable simplified quantitative calculations of adhesion, fracture and friction are discussed.

Ferrante, John↗
NASA NTRS1989

Applications of surface analysis and surface theory in tribology

Tribology, the study of adhesion, friction and wear of materials, is a complex field which requires a knowledge of solid state physics, surface physics, chemistry, material science, and mechanical engineering. It has been dominated, however, by the more practical need to make equipment work. With the advent of surface analysis and advances in surface and solid-state theory, a new dimension has been added to the analysis of interactions at tribological interfaces. In this paper the applications of tribological studies and their limitations are presented. Examples from research at the NASA Lewis Research Center are given. Emphasis is on fundamental studies involving the effects of monolayer coverage and thick films on friction and wear. A summary of the current status of theoretical calculations of defect energetics is presented. In addition, some new theoretical techniques which enable simplified quantitative calculations of adhesion, fracture, and friction are discussed.

Ferrante, John↗
NASA NTRS1984

Tribological applications of surface analysis

For some years, surface analysis was used in fundamental studies of solid-solid contacts existing in tribological systems. Analysis was used to detect material transfer in sliding contacts. The effects of surface films on the adhesion of contacts was monitored. Finally electron spectroscopic analysis of interfaces has shed some light on the fundamental electronic nature of the interfacial bond. More recently, surface analysis was applied to many tribological engineering problems. In particular, identification of chemical films formed during the sliding contact of lubricated systems and study of the surface chemistry of lubricant additives were active areas of research. One or more of four properties of the analytical technique will be important in determining its utility. The four are: lateral resolution, specimen damage, depth resolution and the availability of chemical information. In each of the applications discussed here, the important factors are brought out.

Wheeler, D. R.↗
NASA NTRS1983

Surface analysis in composite bonding

Surface analysis results for graphite fibers and for graphite reinforced composites prior to adhesive bonding and following fracture of lap shear samples are discussed.

Messick, D. L.↗
NASA NTRS2004

adwTools Developed: New Bulk Alloy and Surface Analysis Software for the Alloy Design Workbench

A suite of atomistic modeling software, called the Alloy Design Workbench, has been developed by the Computational Materials Group at the NASA Glenn Research Center and the Ohio Aerospace Institute (OAI). The main goal of this software is to guide and augment experimental materials research and development efforts by creating powerful, yet intuitive, software that combines a graphical user interface with an operating code suitable for real-time atomistic simulations of multicomponent alloy systems. Targeted for experimentalists, the interface is straightforward and requires minimum knowledge of the underlying theory, allowing researchers to focus on the scientific aspects of the work. The centerpiece of the Alloy Design Workbench suite is the adwTools module, which concentrates on the atomistic analysis of surfaces and bulk alloys containing an arbitrary number of elements. An additional module, adwParams, handles ab initio input for the parameterization used in adwTools. Future modules planned for the suite include adwSeg, which will provide numerical predictions for segregation profiles to alloy surfaces and interfaces, and adwReport, which will serve as a window into the database, providing public access to the parameterization data and a repository where users can submit their own findings from the rest of the suite. The entire suite is designed to run on desktop-scale computers. The adwTools module incorporates a custom OAI/Glenn-developed Fortran code based on the BFS (Bozzolo- Ferrante-Smith) method for alloys, ref. 1). The heart of the suite, this code is used to calculate the energetics of different compositions and configurations of atoms.

Bozzolo, Guillermo↗
NASA NTRS1984

Surface analysis of space telescope material specimens

Surface analysis by electron spectroscopy for chemical analysis (ESCA) was used to characterize a number of the material samples for the space telescope. With ESCA, the sample is irradiated with monoenergetic soft X-rays and the resulting emitted electrons are energy analyzed to determine the binding energy of electrons to the surface atoms. The major peaks were used in the quantitative determination of the surface composition. The presence of trace elements (impurities below 1% atomic composition) was also detailed. Initially a survey scan was run for each sample to deduce the elemental composition. Then the major peaks of interest and those of the trace elements were individually examined. After this, the samples were argon sputtered to etch away surface layers, and then additional measurements were carried out in order to obtain depth profile information. In this way it was possible for those species present only on the surface to be distinguished from those having a significant depth distribution within the sample.

Fromhold, A. T.↗
NASA NTRS1992

Surface analysis of anodized aluminum clamps from NASA-LDEF satellite

Surface analysis results of selected anodized aluminum clamps containing black (Z306) and white (A276) paints which received nearly six years of Low Earth Orbit (LEO) exposure on the Long Duration Exposure Facility are reported. Surface analytical techniques, including x-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and scanning electron microscopy/energy dispersive analysis by x-ray (SEM/EDAX), showed significant differences in the surface composition of these materials depending upon the position on the LDEF. Differences in the surface composition are attributed to varying amounts of atomic oxygen and vacuum ultraviolet radiation (VUV). Silicon containing compounds were the primary contaminant detected on the materials.

Grammer, H. L.↗
NASA NTRS2016

Exploring Surface Analysis Techniques for the Detection of Molecular Contaminants on Spacecraft

Molecular contamination is a known area of concern for spacecraft. To mitigate this risk, projects involving space flight hardware set requirements in a contamination control plan that establishes an allocation budget for the exposure of non-volatile residues (NVR) onto critical surfaces. The purpose of this work will focus on non-contact surface analysis and in situ monitoring to mitigate molecular contamination on space flight hardware. By using Scanning Electron Microscopy and Energy Dispersive Spectroscopy (SEM-EDS) with Raman Spectroscopy, an unlikely contaminant was identified on space flight hardware. Using traditional and surface analysis methods provided the broader view of the contamination sources allowing for best fit solutions to prevent any future exposure.

Rutherford, Gugu N.↗
NASA NTRS1998

Optical Surface Analysis Code (OSAC)

The purpose of this modification to the Optical Surface Analysis Code (OSAC) is to upgrade the PSF program to allow the user to get proper diffracted energy normalization even when deliberately obscuring rays with internal obscurations.

Glenn, P.↗
NASA NTRS2000

Elemental Surface Analysis at Ambient Pressure

The development of a portable surface elemental analysis tool based on the excitation of characteristics x-rays at ambient pressure with an electron beam is described.

atmospheric electron x-ray spectrometer XRF EDX ED↗
NASA NTRS1979

Fourier emission infrared microspectrophotometer for surface analysis. I - Application to lubrication problems

A far-infrared interferometer was converted into an emission microspectrophotometer for surface analysis. To cover the mid-infrared as well as the far-infrared the Mylar beamsplitter was made replaceable by a germanium-coated salt plate, and the Moire fringe counting system used to locate the moveable Michelson mirror was improved to read 0.5 micron of mirror displacement. Digital electronics and a dedicated minicomputer were installed for data collection and processing. The most critical element for the recording of weak emission spectra from small areas was, however, a reflecting microscope objective and phase-locked signal detection with simultaneous referencing to a blackbody source. An application of the technique to lubrication problems is shown.

Lauer, J. L.↗
NASA NTRS1979

A fundamental approach to adhesion: Synthesis, surface analysis, thermodynamics and mechanics

Adherend surfaces and fractography were studied using electron spectroscopy for chemical analysis and scanning electron microscopy/energy dispersive analysis of X-rays. In addition, Auger Electron Spectroscopy with depth profiling capability was used. It is shown that contamination of adhesion systems plays an important role not only in determining initial bond strengths but also in the durability of adhesive bonds. It is concluded that the analytical techniques used to characterize and monitor such contamination.

Chen, W.↗
NASA NTRS2008

Surface Analysis of 4-Aminothiophenol Adsorption at Polycrystalline Platinum Electrodes

Formation of self-assembled monolayer (SAM) of 4-aminothiophenol (4-ATP) on polycrystalline platinum electrodes has been studied by surface analysis and electrochemistry techniques. The 4-ATP monolayer was characterized by cyclic voltammetry (CV), Raman spectroscopy, reflection absorption infrared (RAIR) spectroscopy, and X-ray photoelectron spectroscopy (XPS). Cyclic voltammetry (CV) experiments give an idea about the packing quality of the monolayer. RAIR and Raman spectra for 4-ATP modified platinum electrodes showed the characteristic adsorption bands for neat 4-ATP indicating the adsorption of 4-ATP molecules on platinum surface. The adsorption on platinum was also evidenced by the presence of sulfur and nitrogen peaks by XPS survey spectra of the modified platinum electrodes. High resolution XPS studies and RAIR spectrum for platinum electrodes modified with 4-ATP indicate that molecules are sulfur-bonded to the platinum surface. The formation of S-Pt bond suggests that ATP adsorption gives up an amino terminated SAM. Thickness of the monolayer was evaluated via angle-resolved XPS (AR-XPS) analyses. Derivatization of 4-ATP SAM was performed using 16-Br hexadecanoic acid.

Rosario-Castro, Belinda I.↗
NASA NTRS1974

The application of trend surface analysis to a portion of the Apollo 15 X-ray fluorescence data

The present work discusses some useful techniques for the detailed chemical mapping of the lunar surface from X-ray fluorescence data, using Al/Si and Mg/Si intensity ratios and preliminary geologic interpretations of some relatively small lunar physiographic features. It is shown that these features can be distinguished as anomalies by employing trend surface analysis on the data. Some correlations between albedo differences and elemental ratios can be found within mare areas. A useful lower limit of 16 seconds is established for time integrals of Al/Si intensity ratios. It was not possible here to determine the minimum time integration necessary for the best spatial mapping of the Mg/Si data.

Podwysocki, M. H.↗