Application of a Multi-Channel Flash X-ray System for Dynamic Computed Tomography and Time-Resolved Observation of Detonation Failure
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Physics↗
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X-ray tomography of damage dynamics in advanced materials using a laser wakefield accelerator
Additively manufactured (AM) metals offer the potential for customizable, cost-effective components, but qualification and certification are crucial. Key to this process is understanding pore dynamics under stress, typically analyzed using micro-computed tomography. This study introduces laboratory-scale “betatron” x-rays from laser wakefield acceleration as a high-throughput alternative for x-ray tomography of advanced materials, such as AM AlSi10Mg alloys. Coupled with 3D finite element modeling, this method provides detailed insights into stress-porosity interactions. The approach delivers high-resolution scans, revealing that pore shape and local triaxiality significantly influence fracture dynamics, supporting advanced material characterization. This work also demonstrates the potential and versatility of laser-betatron x-ray μCT for generating large datasets to accelerate our understanding of the stochastic, process-specific nature of pore formation in AM alloys.
Senthilkumaran, Vigneshvar↗
Boron-Based Neutron Scintillator Screen Characterization with X-Rays and Neutrons
Recent work on boron-based neutron scintillator screens suggests these screens can offer superior performance when compared to commonly used screens. Borated neutron scintillator screens perform well in terms of light output (5-6 times greater than a standard Gadox screen) and detection effi-ciency (larger than standard LiF+ZnS screens). However, previously manu-factured boron-based screens have exhibited non-uniform surface coating and a poor mixture between phosphor and converter particles. The objective of this work was to evaluate newly fabricated scintillator screens to deter-mine if enhanced fabrication methods produced a more homogeneous distribution between neutron converter and scintillation phosphor particles. Uniformity of scintillator material deposition was also inspected. This new iteration of screens appeared more uniform than previous generations with the new coating method improving surface chemistry and scintillator material homogeneity. Additionally, a new methodology for screen characterization, involving the correlation of a neutron image taken with a borated scintillator screen to X-ray computed tomography of that same screen, was demonstrated to elucidate a relationship between scintillator screen thickness and relative light output of the screen under neutron exposure. This method suggested that the ideal thickness of scintillator material was ~150 µm to maximize light output of the screen.
36 - MATERIALS SCIENCE↗
Dynamic sparse x-ray nanotomography reveals ionomer hydration mechanism in polymer electrolyte fuel-cell catalyst
Tomographic imaging of time-evolving samples is a challenging yet important task for various research fields. At the nanoscale, current approaches face limitations of measurement speed or resolution due to lengthy acquisitions. We developed a dynamic nanotomography technique based on sparse dynamic imaging and 4D tomography modeling. We demonstrated the technique, using ptychographic x-ray computed tomography as its imaging modality, on resolving the in situ hydration process of polymer electrolyte fuel cell (PEFC) catalyst. The technique provides a 40-time increase in temporal resolution compared to conventional approaches, yielding 28 nm half-period spatial and 12 min temporal resolution. The results allow a quantitative characterization of the water intake process inside PEFC catalysts with nanoscale resolution, which is crucial for understanding their electrochemical mechanisms and optimizing their performance. Our technique enables high-speed operando nanotomography studies and paves the way for wider application of dynamic tomography at the nanoscale.
Science & Technology - Other Topics↗
X-ray linear dichroic tomography of crystallographic and topological defects
Abstract The functionality of materials is determined by their composition 1–4 and microstructure, that is, the distribution and orientation of crystalline grains, grain boundaries and the defects within them 5,6 . Until now, characterization techniques that map the distribution of grains, their orientation and the presence of defects have been limited to surface investigations, to spatial resolutions of a few hundred nanometres or to systems of thickness around 100 nm, thus requiring destructive sample preparation for measurements and preventing the study of system-representative volumes or the investigation of materials under operational conditions 7–15 . Here we present X-ray linear dichroic orientation tomography (XL-DOT), a quantitative, non-invasive technique that allows for an intragranular and intergranular characterization of extended polycrystalline and non-crystalline 16 materials in three dimensions. We present the detailed characterization of a polycrystalline sample of vanadium pentoxide (V 2 O 5 ), a key catalyst in the production of sulfuric acid 17 . We determine the nanoscale composition, microstructure and crystal orientation throughout the polycrystalline sample with 73 nm spatial resolution. We identify and characterize grains, as well as twist, tilt and twin grain boundaries. We further observe the creation and annihilation of topological defects promoted by the presence of volume crystallographic defects. The non-destructive and spectroscopic nature of our method opens the door to operando combined chemical and microstructural investigations 11,18 of functional materials, including energy, mechanical and quantum materials.
Science & Technology - Other Topics↗
Structured illumination for surface-resolved grazing-incidence X-ray scattering
Grazing-incidence (GI) scattering techniques are widely used to characterize thin films, offering high surface sensitivity and insight into morphology and structure. However, these approaches typically provide statistical averaged information due to elongated footprint or limited spatial resolution due to beam size. Here we introduce a method that combines structured illumination with GI X-ray scattering and leverages our computational imaging approach to resolve local structural details. We demonstrate that our method captures local features of an organic semiconductor thin film without the need for sample rotation as in tomography. The method expands GI techniques from statistical averaging to high-resolution imaging, thereby providing the capability for detailed analysis of local material properties, such as domain shape, orientation and polymorphism, which are critical for advancing material design towards more efficient and tailored materials.
Gursoy, Doga↗
In-Situ Visualization of a Growing Brittle Crack in Aluminum Oxynitride Using Synchrotron X-Rays and the Double-Cleavage Drilled Compression Geometry
Brittle fracture is difficult to study in situ due to the speed of a growing crack and the often-catastrophic nature of failure in brittle materials. As a result, the influence of microstructural considerations, such as orientation, grain boundary locations, and strain field, on the crack path remains poorly understood. Presented in this study is a method addressing this knowledge gap, which utilizes the double-cleavage drilled compression geometry to achieve quasi-stable fracture in aluminum oxynitride (AlON). Synchrotron X-ray micro-computed tomography is used to characterize the crack shape and length, while high-energy diffraction microscopy provides information on the strains, orientations, and shapes of grains in the microstructure surrounding the crack tip. During testing, the crack grew in discrete and irregular jumps while the fracture toughness falls within reported ranges. The crack in AlON is found to have no greater tendency to crack intergranularly as compared to transgranularly, and grains which are cracked transgranularly do not display a trend in orientation or stress when compared to those around which the crack followed a grain boundary. The high resolution of the crack path and microstructural data provides a path forward for modeling and understanding 3D brittle fracture.
Gorske, Sara F.↗
Thermo-Poro-Mechanical Modeling of RTV Intumescence
Room temperature vulcanizing (RTV) silicone is a high-temperature adhesive used as a gap-filler between heatshield tiles in numerous entry missions. Its propensity to intumesce, or swell upon exposure to heat, is a well-known effect that needs to be carefully quantified during design. At tile interfaces of charring ablators, intumescence, combined with differential recession, could cause the gap filler to protrude past the ablator outer mold line, forming a “fence”. Fencing can in turn cause transition to turbulence of the flow wetting the heat shield, leading to augmented surface heating. Recent experiments conducted at the Plasmatron X facility, the high enthalpy wind tunnel of the Center for Hypersonics and Entry Systems Studies, have shown prominent fencing of RTV gap fillers in PICA, under both nitrogen and air plasmas. Similar observations are well known in the arcjet literature. Further experiments under controlled environment, performed using in situ X-ray micro-computed tomography (micro-CT) at the Advanced Light Source (ALS), have shown heating rate-dependent swelling and shrinkage of RTV during pyrolysis. To simulate RTV intumescence, a novel model was introduced in the Porous Materials Analysis Toolbox based on OpenFOAM, PATO, to account for pore-pressure buildup within both closed- and open-pores. The governing equation for the thermo-poro-mechanical response were developed, assuming linear elasticity for the charring silicone. A new multi-pyrolysis model that tracks non-monotonic advancement of material properties with pyrolysis was proposed. This model addresses the limitations of state-of-the-art ablator models to capture the different stages of thermal degradation and coupled thermomechanics. Swelling of RTV was simulated using the new thermo-poro-mechanical model and compared against in situ micro-CT data. Results showed good agreement in intumescence height and temperature profiles at all heating rates, indicating that the key factor contributing to RTV swelling is the internal pressure build-up within closed- and open-pores. As RTV is cured into a soft (rubbery) compound with low-porosity and permeability, initial temperature increase and pyrolysis gas production cause a significant increase of internal pressure, causing a pronounced volume growth. As thermal degradation progresses, rigidization of the silicone occurs due to char hardening which counteract volume shrinkage after gas pressure relief. Overall, our model shows that accounting for changes in properties such porosity, permeability and key thermomechanical coefficients is crucial for capturing the RTV volume change during ablation and enable a predictive capability for heatshield tile interface response. A plan for future calibration of thermomechanical properties evolution during degradation is discussed, as a key next step to close the new model.
RTV↗
Thermo-Poro-Mechanical Modeling of RTV Intumescence
Room temperature vulcanizing (RTV) silicone is a high-temperature adhesive used as a gap-filler between heatshield tiles in numerous entry missions. Its propensity to intumesce, or swell upon exposure to heat, is a well-known effect that needs to be carefully quantified during design. At tile interfaces of charring ablators, intumescence, combined with differential recession, could cause the gap filler to protrude past the ablator outer mold line, forming a “fence”. Fencing can in turn cause transition to turbulence of the flow wetting the heat shield, leading to augmented surface heating. Recent experiments conducted at the Plasmatron X facility, the high enthalpy wind tunnel of the Center for Hypersonics and Entry Systems Studies, have shown prominent fencing of RTV gap fillers in PICA, under both nitrogen and air plasmas. Similar observations are well known in the arcjet literature. Further experiments under controlled environment, performed using in situ X-ray micro-computed tomography (micro-CT) at the Advanced Light Source (ALS), have shown heating rate-dependent swelling and shrinkage of RTV during pyrolysis. To simulate RTV intumescence, a novel model was introduced in the Porous Materials Analysis Toolbox based on OpenFOAM, PATO, to account for pore-pressure buildup within both closed- and open-pores. The governing equation for the thermo-poro-mechanical response were developed, assuming linear elasticity for the charring silicone. A new multi-pyrolysis model that tracks non-monotonic advancement of material properties with pyrolysis was proposed. This model addresses the limitations of state-of-the-art ablator models to capture the different stages of thermal degradation and coupled thermomechanics. Swelling of RTV was simulated using the new thermo-poro-mechanical model and compared against in situ micro-CT data. Results showed good agreement in intumescence height and temperature profiles at all heating rates, indicating that the key factor contributing to RTV swelling is the internal pressure build-up within closed- and open-pores. As RTV is cured into a soft (rubbery) compound with low-porosity and permeability, initial temperature increase and pyrolysis gas production cause a significant increase of internal pressure, causing a pronounced volume growth. As thermal degradation progresses, rigidization of the silicone occurs due to char hardening which counteract volume shrinkage after gas pressure relief. Overall, our model shows that accounting for changes in properties such porosity, permeability and key thermomechanical coefficients is crucial for capturing the RTV volume change during ablation and enable a predictive capability for heatshield tile interface response. A plan for future calibration of thermomechanical properties evolution during degradation is discussed, as a key next step to close the new model.
silicone intumescence↗
Next-Generation Hard X-ray Missions: SuperHERO and HEROIX
High-energy X-ray observations have transformed our understanding of astrophysical systems where non-thermal processes dominate, from shock-accelerated particles in supernova remnants to relativistic jets and hot coronae in active galactic nuclei. NuSTAR’s pioneering focusing images of the hard X-ray sky have demonstrated the immense scientific potential of this band, while also highlighting how limited angular resolution constrains our ability to fully characterize complex physical processes in faint extended sources and resolving faint sources in crowded sky regions. In this presentation, I will discuss a pathway to overcome these challenges through NASA Marshall Space Flight Center’s replicated NiCo full-shell X-ray mirror technology. Specifically, I will discuss the SuperHERO hard X-ray telescope to achieve better than 10-arcsecond half-power diameter (HPD) angular resolution on a balloon flight observing the Crab Nebula, and the High EneRgy Observatory for Imaging X-rays (HEROIX) Medium-Class Mission concept to achieve an integrated effective area of 570 cm2 at 30 keV with 5 arcsec HPD angular resolution.
AGN↗
High EneRgy Observatory for Imaging X-rays (HEROIX) Mission Concept
The High EneRgy Observatory for Imaging X-rays (HEROIX) is a next-generation broadband X-ray space telescope concept under development as a Medium-Class Explorer mission. Building on more than three decades of replicated NiCo shell technology at NASA’s Marshall Space Flight Center, HEROIX will deliver 5 arcsecond half-power-diameter imaging resolution in the hard X-ray band. The observatory will incorporate four co-aligned telescopes with advanced multilayer coatings, extending the bandpass into the hard X-ray regime and providing an integrated effective area of 380 cm² at 30 keV. A suite of focal plane detectors will enable imaging capability throughout its 1–80 keV bandpass. This combination of angular resolution and high-energy coverage will open new windows into non-thermal processes in extreme astrophysical environments. HEROIXwill deliver transformative science, advancing the astrophysics community’s understanding of supernova physics, the X-ray binary population of the Galactic Center, accretion-driven galaxy evolution, and the origin of the Cosmic X-ray Background.
Nick Thomas↗
Impact of the Annealing Temperature on the Local Se Distribution and Optical Properties in CdSexTe1-x Solar Cells by Multimodal X-ray Microscopy
The introduction of Se in CdTe solar-cell absorbers has led to multiple beneficial effects in the devices, including an increased short-circuit current and an extended charge-carrier lifetime. A critical manufacturing step of CdSexTe1-x solar cells is CdCl2 annealing at high temperatures, during which Se diffuses through the absorber layer. Understanding the local Se distribution in the absorber and its impact on optical properties of the material is key for the further development of this thin-film solar cell technology. In a multimodal x-ray scanning microscopy approach, we investigated the impact of the annealing temperature of CdSexTe1-x solar cells on the Se distribution and on optical characteristics of the material. For this purpose, we exploited an upgraded x-ray excited optical luminescence (XEOL) detection unit that enables simultaneous spectrally and temporally resolved XEOL mapping at synchrotron facilities that are ideal for studying thin-film solar-cell materials with hard x-rays featuring high penetration depth and lateral resolution.
14 SOLAR ENERGY↗
X-Ray Polarization From the Atoll 4U 1735−44 Suggests a Low Inclination
X-ray polarimetry is a new tool capable of probing the geometry of accretion onto weakly magnetized neutron stars. Here we present the first X-ray spectro-polarimetric results from coordinated observations of the atoll source 4U 1735−44, conducted with the Imaging X-ray Polarimetry Explorer (IXPE), NICER, and NuSTAR . Over the 2–8 keV energy range, we obtained a marginal detection of polarization with the polarization degree of 1.4% ± 0.7% and polarization angle of −29◦ ± 14◦, corresponding to a 3σ upper limit on the polarization degree of 3.5%. The best-fit model to describe the spectrum comprises a thermal component associated with the accretion disk, a Comptonized black body component, and a relativistic reflection component. From the reflection model, we infer a disk inclination of ∼40◦. The spectroscopic and polarimetric properties of 4U 1735−44 are consistent with those observed in other atoll sources studied by IXPE, with its low polarization likely due to its low inclination
X-rays: binaries↗
X-Ray Polarization of Z-Type Neutron Star Low-Mass X-Ray Binaries II. Spectropolarimetric Analysis
IXPE has provided for the first time detailed energy- and time-resolved X-ray polarimetry of Z-type neutron star low-mass X-ray binaries (NS-LMXBs) as they move along their color-color diagrams (CCDs). These sources can reach the highest polarization observed for NS-LXMBs in the 2–8 keV range when they move along the horizontal branch. In a previous paper, we characterized the spectral state of a sample of Z-sources using the CCD and estimated the polarization with model-independent analysis. Here, we present detailed spectropolarimetric analysis for each source on each branch using data from IXPE, NICER, and NuSTAR. The continuum X-ray emission of all the sources is well described with a combination of thermal accretion disk emission plus a harder Comptonized component. In addition, reflection features, in particular the relativistically broadened Fe Kα line, are observed for our sources, except GX 5–1. For most of the sources and branches, the main contribution to the X-ray emission and polarization is due to Comptonization: moving from the horizontal branch (HB) to the normal branch (NB), the polarization degree (PD) in the 2–8 keV band varies from about 6% to 3–4%, while the PD is loosely constrained in the flaring branch (FB), due to the shorter exposures. These PD values are significantly higher than theoretical expectations for typical spreading or boundary layer configurations. The polarization of the disk is generally lower (below 3%) but still higher than predictions for an electron scattering-dominated, plane-parallel atmosphere above the disk observed at the corresponding inclination. Moreover, the polarization angle (PA) of the disk seems to be significantly misaligned and not perpendicular to that of Comptonization. We find no correlation between the polarization signal and the inclination, nor with the contribution of reflected photons throughout the Z-track.
accretion↗
Investigation of battery active nickel oxides First quarterly report
X-ray diffraction patterns of nickel-cadmium battery electrodes and stabilization of nickel oxides and hydroxides
ELECTRODE↗
Understanding the fast kinetics and mechanism of sodium storage in antimony using ab initio grand canonical Monte Carlo simulation and operando X-ray scattering
Using ai-GCMC simulations,operandoWAXS, and kinetics analysis, we found that the high-rate performance of Sb as an alloy anode in Na-ion batteries is due to the presence of an amorphous intermediate phase formed during sodiation and desodiation.
Chemistry↗
The Electron‐Density Distribution of UCl 4 and Its Topology from X‐ray Diffraction
Abstract The chemistry of electrons in actinide complexes and materials is still poorly understood and represents a serious challenge and opportunity for experiment and theory. The study of the electron density distribution of the ground state of such systems through X‐ray diffraction represents a unique opportunity to quantitatively investigate different chemical bonding interactions at once, but was considered “almost impossible” on heavy‐atom systems, until very recently. Here, we present a combined experimental and theoretical investigation of the electron density distribution in UCl_ 4 crystals and comparison with the previously reported spin density distribution from polarized neutron diffraction. All approaches provide a consistent picture in terms of electron and spin density distribution, and chemical bond characterization. More importantly, the synergy between experiments and quantum‐mechanical calculations allows to highlight the remarkable sensitivity of X‐ray diffraction to electrons in materials.
Chemistry↗