Assessing application vulnerability to radiation-induced SEUs in RAM
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radiation SEU software vulnerability↗
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Assessing application vulnerability to radiation-induced SEUs in memory
One of the goals of the Remote Exploration and Experimentation (REE) project at JPL is to determine how vulnerable applications are to single event upsets (SEUs) when run in low radiation space environments using commercial-off-the-shelf (COTS) components.
radiation SEU software vulnerability↗