Project ''diode reliability prediction technique''
Mathematical models for predicting reliability of semiconductor diodes
MATHEMATICAL MODEL↗
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Interface Program for Reliability Predictions
CARE3MENU generates input file for CARE III program. Used to predict reliabilities of complex, redundant, fault-tolerant systems, including digital computers, aircraft, and nuclear and chemical control systems. CARE III input file often becomes complicated and not easily formatted with text editor. Provides easy interactive method of creating input file by automatically formatting set of user-supplied inputs for CARE III system. CARE3MENU provides detailed online help for most of its screen formats.
Bavuso, S. J.↗
Earth Observing System/Advanced Microwave Sounding Unit-A (EOS/AMSU-A): Reliability prediction report for module A1 (channels 3 through 15) and module A2 (channels 1 and 2)
This report documents the final reliability prediction performed on the Earth Observing System/Advanced Microwave Sounding Unit-A (EOS/AMSU-A). The A1 Module contains Channels 3 through 15, and is referred to herein as 'EOS/AMSU-A1'. The A2 Module contains Channels 1 and 2, and is referred herein as 'EOS/AMSU-A2'. The 'specified' figures were obtained from Aerojet Reports 8897-1 and 9116-1. The predicted reliability figure for the EOS/AMSU-A1 meets the specified value and provides a Mean Time Between Failures (MTBF) of 74,390 hours. The predicted reliability figure for the EOS/AMSU-A2 meets the specified value and provides a MTBF of 193,110 hours.
Geimer, W.↗
Evaluation of competing software reliability predictions
Different software reliability models can produce very different answers when called upon to predict future reliability in a reliability growth context. Users need to know which, if any, of the competing predictions are trustworthy. Some techniques are presented which form the basis of a partial solution to this problem. Rather than attempting to decide which model is generally best, the approach adopted here allows a user to decide upon the most appropriate model for each application.
Abdel-Ghaly, A. A.↗
Reliability prediction - an engineering appraisal.
Reliability predictions showing need of bench- mark with respect to component part failure rates
COMPONENT RELIABILITY↗
Reliability prediction activities in the Apollo program.
Reliability prediction, modeling and analysis activities in Apollo program
PERFORMANCE PREDICTION↗
A computer model for system reliability prediction
Computer program for system reliability prediction, using probability tree approach and block probabilities
Chelson, P.↗
Meteorological Satellites (METSAT) and Earth Observing System (EOS) Advanced Microwave Sounding Unit-A (AMSU-A). Reliability Prediction Report
This report documents the reliability prediction performed on the Meteorological Satellites (METSAT) and the Earth Observing System (EOS) Advanced Microwave Sounding Unit-A (AMSU-A) instruments.
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Ultrahigh reliability prediction for fault-tolerant computer systems
A review and a critical evaluation of a representative class of state-of-the-art models for ultrahigh reliability prediction is presented. This evaluation naturally leads to a new model for ultrahigh reliability prediction now under development. The new model combines the flexibility and accuracy of simulation with the speed of analytic models.
Geist, R. M.↗
Reliability prediction for a class of highly reliable digital systems
Three theorems which show that the reliability of a popular class of systems can be computed using small and simple models are presented. This class consists of systems that are assemblages of subsystems where each subsystem is a majority-voting threeplex plus spares or majority-voting fourplex plus spares. The theorems are error bounds for model reduction and simplification. The error bounds are given in terms of readily available system parameters. The three theorems have been applied to a system that has been used as an example that generates extremely large reliability models; the system considered is one version of AIPS (Advanced Information Processing System) for IAPSA (Integrated Airframe Propulsion System Architecture).
White, Allan L.↗
Development of reliability prediction technique for semiconductor diodes
New fundamental technique of reliability prediction for semiconductor diodes based on realistic mathematical models can be applied to component failure rate prediction including mechanical degradation, electrical degradation, environmental stress factors, and electrical load stress factors.
Ryerson, C. M.↗
Calculations of reliability predictions for the Apollo spacecraft
A new method of reliability prediction for complex systems is defined. Calculation of both upper and lower bounds are involved, and a procedure for combining the two to yield an approximately true prediction value is presented. Both mission success and crew safety predictions can be calculated, and success probabilities can be obtained for individual mission phases or subsystems. Primary consideration is given to evaluating cases involving zero or one failure per subsystem, and the results of these evaluations are then used for analyzing multiple failure cases. Extensive development is provided for the overall mission success and crew safety equations for both the upper and lower bounds.
Amstadter, B. L.↗
Robustness of Reliability Predictions for a Series System of Identical Components
Robustness of reliability predictions for series systems with identical components, assuming exponential failure distribution
Leitao, C. D.↗
Feasibility of developing LSI microcircuit reliability prediction models
In the proposed modeling approach, when any of the essential key factors are not known initially, they can be approximated in various ways with a known impact on the accuracy of the final predictions. For example, on any program where reliability predictions are started at interim states of project completion, a-priori approximate estimates of the key factors are established for making preliminary predictions. Later these are refined for greater accuracy as subsequent program information of a more definitive nature becomes available. Specific steps to develop, validate and verify these new models are described.
Ryerson, C. M.↗
The robustness of reliability predictions for series systems of identical components.
The robustness of reliability predictions based on the exponential failure law is investigated under possible deviations within the Weibull family of failure distributions. Regions of robustness are provided for series systems of N identical components, N = 1(1)15; i.e., regions in the space of the Weibull shape parameter, within which one may safely use the exponential prediction procedure and have no more than a prespecified error.
Posten, H. O.↗
Lifetime Reliability Prediction of Ceramic Structures Under Transient Thermomechanical Loads
An analytical methodology is developed to predict the probability of survival (reliability) of ceramic components subjected to harsh thermomechanical loads that can vary with time (transient reliability analysis). This capability enables more accurate prediction of ceramic component integrity against fracture in situations such as turbine startup and shutdown, operational vibrations, atmospheric reentry, or other rapid heating or cooling situations (thermal shock). The transient reliability analysis methodology developed herein incorporates the following features: fast-fracture transient analysis (reliability analysis without slow crack growth, SCG); transient analysis with SCG (reliability analysis with time-dependent damage due to SCG); a computationally efficient algorithm to compute the reliability for components subjected to repeated transient loading (block loading); cyclic fatigue modeling using a combined SCG and Walker fatigue law; proof testing for transient loads; and Weibull and fatigue parameters that are allowed to vary with temperature or time. Component-to-component variation in strength (stochastic strength response) is accounted for with the Weibull distribution, and either the principle of independent action or the Batdorf theory is used to predict the effect of multiaxial stresses on reliability. The reliability analysis can be performed either as a function of the component surface (for surface-distributed flaws) or component volume (for volume-distributed flaws). The transient reliability analysis capability has been added to the NASA CARES/ Life (Ceramic Analysis and Reliability Evaluation of Structures/Life) code. CARES/Life was also updated to interface with commercially available finite element analysis software, such as ANSYS, when used to model the effects of transient load histories. Examples are provided to demonstrate the features of the methodology as implemented in the CARES/Life program.
Nemeth, Noel N.↗
Reliability Prediction
RELAV, a NASA-developed computer program, enables Systems Control Technology, Inc. (SCT) to predict performance of aircraft subsystems. RELAV provides a system level evaluation of a technology. Systems, the mechanism of a landing gear for example, are first described as a set of components performing a specific function. RELAV analyzes the total system and the individual subsystem probabilities to predict success probability, and reliability. This information is then translated into operational support and maintenance requirements. SCT provides research and development services in support of government contracts.
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