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At least 19 records

Test vectors development and optimization for a microprocessor

This paper describes a method for generating and optimizing test vectors for a microprocessor, with the aid of a fault simulator implemented entirely by hardware. The development and optimization of test vectors has been done on a tester, with the fault simulator plugged directly into the test head. The fault simulator is capable of automatically injecting over a thousand single or multiple stuck faults in the sequential and combinatorial parts of the microprocessor. The test vectors developed by a programmer working interactively with the tester were applied through the tester to the fault simulator, and the percent of faults detected was measured. The vectors were developed and optimized for the 1802 microprocessor, with the objective of detecting 100% of the single stuck faults with a minimum set of vectors. Experimental results show that 99.7% of the single stuck faults are being detected with approximately 14,000 vectors.

Timoc, C. C.

MIL-M-38510/470 test vectors: Fault detection efficiency measurement via hardware fault simulation

The stuck fault detection efficiency of the test vectors developed for the MIL-M-38510/470 NASA was measured using a hardware stuck fault simulator for the 1802 microprocessor. Thirty-nine stuck faults were not detected out of a total of 874 injected into the combinatorial and sequential parts of the microprocessor. Since undetected faults can create catastrophic errors in equipment designed for high reliability applications, it is recommended that the MIL-M-38510/470 NASA be enhanced with additional test vectors so as to achieve 100% stuck fault detection efficiency.

Timoc, C. C.

Terminal Area Test Vector Development

This presentation provides an overview of work being done to develop test vectors for the terminal area, in coordination with RTCA Special Committee 228, an organization developing the Minimum Operational Performance Standards (MOPS) for Unmanned Aircraft Systems (UAS) Detect and Avoid (DAA) systems. The work leverages existing encounter data to develop a set of encounters to be used to define and refine both performance-based and functionally-based terminal area MOPS requirements. The encounter set would be used across various organizations supporting MOPS terminal area requirements development to provide some level of consistency in terms of terminal area assumptions. The work will investigate other potentially applicable data sets and make any similarly needed adjustments to arrive at a consolidated set of terminal area encounters.

terminal area

Hardware Fault Simulator Generates Test Vectors For Complex IC's

Report describes technique using fault simulator implemented entirely in hardware to generate and optimize test vectors for microprocessor. Hardware fault simulator approach reduces test time, while maintaining high reliability in detecting faults.

Timoc, C. C.

TAO Test Vector Evaluation Rev. 1

A group of encounter sets is evaluated as a standard for defining and refining both performance-based and functional-based terminal area MOPS requirements. DAIDALUS-alerting is used together with a variety of sensor configurations: (1) ADS-B level surveillance, (2) TCAS II, (3) ground-based RADAR with three different sets of error parameters.

Adami, Tony

Test aspects of the JPL Viterbi decoder

The generation of test vectors and design-for-test aspects of the Jet Propulsion Laboratory (JPL) Very Large Scale Integration (VLSI) Viterbi decoder chip is discussed. Each processor integrated circuit (IC) contains over 20,000 gates. To achieve a high degree of testability, a scan architecture is employed. The logic has been partitioned so that very few test vectors are required to test the entire chip. In addition, since several blocks of logic are replicated numerous times on this chip, test vectors need only be generated for each block, rather than for the entire circuit. These unique blocks of logic have been identified and test sets generated for them. The approach employed for testing was to use pseudo-exhaustive test vectors whenever feasible. That is, each cone of logid is tested exhaustively. Using this approach, no detailed logic design or fault model is required. All faults which modify the function of a block of combinational logic are detected, such as all irredundant single and multiple stuck-at faults.

Breuer, M. A.

A fault injection experiment using the AIRLAB Diagnostic Emulation Facility

The preparation for, conduct of, and results of a simulation based fault injection experiment conducted using the AIRLAB Diagnostic Emulation facilities is described. An objective of this experiment was to determine the effectiveness of the diagnostic self-test sequences used to uncover latent faults in a logic network providing the key fault tolerance features for a flight control computer. Another objective was to develop methods, tools, and techniques for conducting the experiment. More than 1600 faults were injected into a logic gate level model of the Data Communicator/Interstage (C/I). For each fault injected, diagnostic self-test sequences consisting of over 300 test vectors were supplied to the C/I model as inputs. For each test vector within a test sequence, the outputs from the C/I model were compared to the outputs of a fault free C/I. If the outputs differed, the fault was considered detectable for the given test vector. These results were then analyzed to determine the effectiveness of some test sequences. The results established coverage of selt-test diagnostics, identified areas in the C/I logic where the tests did not locate faults, and suggest fault latency reduction opportunities.

Baker, Robert

Accelerating multigrid with streaming chiral SVD for Wilson fermions in lattice QCD

A modification to the setup algorithm for the multigrid preconditioner of Wilson fermions in lattice QCD is presented. A larger basis of test vectors than that used in regular multigrid is calculated by the smoother and truncated by singular value decomposition on the chiral components of the test vectors. The truncated basis is used to form the prolongation and restriction matrices of the multigrid hierarchy. This modification of the setup method is demonstrated to increase the convergence of linear solvers on an anisotropic lattice with m π ≈ 239 MeV from the Hadron Spectrum Collaboration and an isotropic lattice with m π ≈ 220 MeV from the MILC Collaboration. The lattice volume dependence of the method is also examined. Increasing the number of test vectors improves speedup up to a point, but storing these vectors becomes impossible in limited memory resources such as GPUs. To address storage cost, we implement a streaming singular value decomposition of the basis of test vectors on the chiral components and demonstrate a decrease in the number of fine level iterations by a factor of 1.7 for m q ≈ m crit

Iterative methods

Chiral rank-$k$ truncations for the multigrid preconditioner of Wilson fermions in lattice QCD

We present a modification to the setup algorithm for the multigrid preconditioner of Wilson fermions in lattice QCD. A larger number of test vectors than that used in conventional multigrid is generated by the smoother. This set of test vectors is then truncated by a singular value decomposition on the chiral components of the test vectors, which are subsequently used to form the prolongation and restriction matrices of the multigrid hierarchy. This modification is demonstrated to improve the convergence of linear equations on an anisotropic lattice with 𝑚𝜋 ≈ 280 MeV from the Hadron Spectrum Collaboration and an isotropic lattice with 𝑚𝜋 ≈ 220 MeV from the MILC Collaboration. The lattice volume dependence of the method is also examined.

Whyte, Travis [Jülich Supercomputing Center, Jülic

Fluidic scale model multi-plane thrust vector control test results

An experimental investigation has been conducted at the NASA Langley 16-Foot Transonic Tunnel Static Test Facility to determine the concept feasibility of using fluidics to achieve multiplane thrust vector control in a 2D convergent-divergent (2D-CD) fixed aperture nozzle. Pitch thrust vector control is achieved by injection of flow through a slot in the divergent flap into the primary nozzle flow stream. Yaw vector control results from secondary air delivered tangentially to vertical Coanda flaps. These flaps are offset laterally and aligned parallel to the primary nozzle side walls. All tests were conducted at static (no external flow) conditions. Flow visualization was conducted using a paint flow technique and Focus Schlieren. Significant levels of pitch deflection angles (19 deg) were achieved at low pressure ratios and practical levels (14 deg) resulted at typical intermediate power settings. The ability of the Coanda surface blowing concept to produce yaw deflection was limited to NPR not greater than 4.

Chiarelli, Charles

Failure detection and isolation analysis of a redundant strapdown inertial measurement unit

The objective of this study was to define and develop techniques for failure detection and isolation (FDI) algorithms for a dual fail/operational redundant strapdown inertial navigation system are defined and developed. The FDI techniques chosen include provisions for hard and soft failure detection in the context of flight control and navigation. Analyses were done to determine error detection and switching levels for the inertial navigation system, which is intended for a conventional takeoff or landing (CTOL) operating environment. In addition, investigations of false alarms and missed alarms were included for the FDI techniques developed, along with the analyses of filters to be used in conjunction with FDI processing. Two specific FDI algorithms were compared: the generalized likelihood test and the edge vector test. A deterministic digital computer simulation was used to compare and evaluate the algorithms and FDI systems.

Motyka, P.

Segmented testing

The fraction of faults detected for a digital network is frequently high for the first few input combinations applied out of a set of test vectors. When the particular ordering of test patterns does not appreciably change the shape of the coverage curve, there appears to be an advantage to splitting the test into segments which are applied at different times. It is shown that the expected time to error detection and the probability of an undetected double error can be reduced. The amount of reduction is dependent on the shape of the fault coverage curve. It is conjectured that such a reduction can be obtained for VLSI networks.

Robinson, J. P.

Segmented testing

The fraction of faults detected for a digital network is frequently high for the first few input combinations applied out of a set of test vectors. When the particular ordering of test patterns does not appreciably change the shape of the coverage curve, there appears to be an advantage to splitting the test into segments which are applied at different times. It is shown that the expected time to error detection and the probability of an undetected double error can be reduced. The amount of reduction is dependent on the shape of the fault coverage curve. It is conjectured that such a reduction can be obtained for VLSI networks.

Robinson, J. P.

Radiation hardened microprocessor for small payloads

The RH-3000 program is developing a rad-hard space qualified 32-bit MIPS R-3000 RISC processor under the Naval Research Lab sponsorship. In addition, under IR&D Harris is developing RHC-3000 for embedded control applications where low cost and radiation tolerance are primary concerns. The development program leverages heavily from commercial development of the MIPS R-3000. The commercial R-3000 has a large installed user base and several foundry partners are currently producing a wide variety of R-3000 derivative products. One of the MIPS derivative products, the LR33000 from LSI Logic, was used as the basis for the design of the RH-3000 chipset. The RH-3000 chipset consists of three core chips and two support chips. The core chips include the CPU, which is the R-3000 integer unit and the FPA/MD chip pair, which performs the R-3010 floating point functions. The two support whips contain all the support functions required for fault tolerance support, real-time support, memory management, timers, and other functions. The Harris development effort had first passed silicon success in June, 1992 with the first rad-hard 32-bit RH-3000 CPU chip. The CPU device is 30 kgates, has a 508 mil by 503 mil die size and is fabricated at Harris Semiconductor on the rad-hard CMOS Silicon on Sapphire (SOS) process. The CPU device successfully passed tesing against 600,000 test vectors derived directly on the LSI/MIPS test suite and has been operational as a single board computer running C code for the past year. In addition, the RH-3000 program has developed the methodology for converting commercially developed designs utilizing logic synthesis techniques based on a combination of VHDK and schematic data bases.

Shah, Ravi

Review of V/STOL lift/cruise fan technology

This paper presents an overview of supporting technology programs conducted to reduce the risk in the joint NASA/Navy Lift/Cruise Fan Research and Technology Aircraft Program. The aeronautical community has endeavored to combine the low-speed and lifting capabilities of the helicopter with the high-speed capabilities of the jet aircraft; recent developments have indicated a lift/cruise fan propulsion system may provide these desired characteristics. NASA and the Navy have formulated a program that will provide a research and technology aircraft to furnish viability of the lift/cruise fan aircraft through flight experiences and obtain data on designs for future naval and civil V/STOL aircraft. The supporting technology programs discussed include: (1) design studies for operational aircraft, a research and technology aircraft, and associated propulsion systems; (2) wind-tunnel tests of several configurations; (3) propulsion-system thrust vectoring tests; and (4) simulation. These supporting technology programs have indicated that a satisfactory research and technology aircraft program can be accomplished within the current level of technology.

Rolls, L. S.

Model-Driven Test Generation of Distributed Systems

This report describes a novel test generation technique for distributed systems. Utilizing formal models and formal verification tools, spe cifically the Symbolic Analysis Laboratory (SAL) tool-suite from SRI, we present techniques to generate concurrent test vectors for distrib uted systems. These are initially explored within an informal test validation context and later extended to achieve full MC/DC coverage of the TTEthernet protocol operating within a system-centric context.

Easwaran, Arvind