Engineering topics
Publications and source records attributed to Kayali, S..
Application of Semiconductor devices in high reliability space systems requires a thorough understanding of the reliability and failure mechanisms associated with the selected devices.
Photoemission spectra of a GaAs gate material of a metal semiconductor field effect transistor (MESFET) were analyzed to nondestructively assess the submicron-size local gate temperature.
This paper provides a description of the reliability and qualification issues related to the application of III/V semiconductor devices in critical space systems.
We have successfully fabricated intersubband GaAs/AlGaAs quantum well infrared photodetectors grown on GaAs-on-Si substrate and evaluated their structural, electrical, and optical characteristics. We have found that the performance is comparable to a similar detector structure grown on a semi-insulating GaAs substrate.
An in-situ optical technique based on infrared emission spectroscopy has been developed for non-contact measurement of the temperature of a hot spot in the gate channel of a GaAs metal/semiconductor field effect transistor (MESFET).
Accelerated lifetime tests have been performed on intergrated planar GaAs Schottky diodes that were bonded to quartz substrates up-side-down with a heat-cured epoxy.
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This paper discusses the need for a space qualification guide, provides a brief description of some common GaAs failure mechanisms, the approach that the NASA MMIC Reliability Assurance Program is following to develop the guide, and the status of the program.
The database consists of two main sections, the data references and the device reliability records. The reference section contains 8 fields: reference number, date of publication, authors, article title, publisher, volume, and page numbers.
Heterojunction Bipolar Transistors (HBTs) are increasingly employed in high frequency, high linerity, and high efficiency applications. As the utilization of these devices becomes more widespread, their operation will be viewed with more scrutiny.
Over the past few years considerable advancements have been made in the design and manufacture of Millimeter-Wave/Microwave Monolithic Integrated Circuits (MMIC).
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