NASA NTRS · 19660028391
Overlay copy technique to provide high-contrast electron micrographs for automatic metallographic analysis
Abstract
Overlay copy technique to provide high-contrast electron micrographs for automatically determining quantitative microstructure of multiphase specimens
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Cremens, W. S., Norris, L. F., Weeton, J. W.. 1966-10-01. Overlay copy technique to provide high-contrast electron micrographs for automatic metallographic analysis. https://ntrs.nasa.gov/citations/19660028391
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