Rietveld texture analysis from synchrotron diffraction images. I. Calibration and basic analysis

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Lutterotti, Luca, Vasin, Roman, Wenk, Hans-Rudolf. 2014-01-23. Rietveld texture analysis from synchrotron diffraction images. I. Calibration and basic analysis. https://doi.org/10.1017/s0885715613001346

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