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DOE OSTI · 1471676

Test circuits for integrated circuit counterfeit detection

Helinski, Ryan·Pierson, Jr., Lyndon G.·Cole, Jr., Edward I.·Thai, Tan Q.
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Abstract

Described herein are various technologies pertaining to identifying counterfeit integrated circuits (ICs) by way of allowing the origin of fabrication to be verified. An IC comprises a main circuit and a test circuit that is independent of the main circuit. The test circuit comprises at least one ring oscillator (RO) signal that, when energized, is configured to output a signal that is indicative of a semiconductor fabrication facility where the IC was manufactured.

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BibTeXRIS

Helinski, Ryan, Pierson, Jr., Lyndon G., Cole, Jr., Edward I., Thai, Tan Q.. 2018-08-28. Test circuits for integrated circuit counterfeit detection. https://www.osti.gov/biblio/1471676

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