SRAM Multi-Cell Upset Vulnerability at the 5-nm FinFET Node.

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Pieper, Nicholas, Xiong, Yoni, Feeley, Alexandra, Pasternak, John, Dodds, Nathaniel, Ball, Dennis, Bharat, Bhuva. 2022-07-01. SRAM Multi-Cell Upset Vulnerability at the 5-nm FinFET Node.. https://www.osti.gov/biblio/2004056

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