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DOE OSTI · 2331212

Electrophoretic deposition for improved trace element homogeneity in silica reference materials

Boone, Peter S.·Harris, Sharee·Ramon, Christina·Shusterman, Jennifer·Pascall, Andrew J.·Parsons-Davis, Tashi
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Abstract

Spatially-resolved analysis requires homogeneous reference materials (RMs) to make reliable quantitative measurements. Here we previously developed an electrophoretic deposition (EPD) method for fabrication of glassy microanalytical RMs with superior platinum-group element homogeneity **[1], and now include further dopants. For 39 trace elements, we analyzed dopant homogeneity in sintered silica (SiO 2 ) samples consolidated either mechanically by die-pressing (DP) or by EPD. A set of EPD and DP samples was made from each of two nanoparticle feedstocks produced by variations of the Stöber process **[2]. Spatially-resolved dopant distribution was characterized in all samples by laser-ablation inductively-coupled plasma mass spectrometry (LA-ICP-MS). In both sample sets, homogeneity of most trace elements was substantially improved by EPD relative to their DP counterpart.

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36 MATERIALS SCIENCE37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY77 NANOSCIENCE AND NANOTECHNOLOGYadditive manufacturingelectrodepositionnanoparticles

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Boone, Peter S., Harris, Sharee, Ramon, Christina, Shusterman, Jennifer, Pascall, Andrew J., Parsons-Davis, Tashi. 2024-02-05. Electrophoretic deposition for improved trace element homogeneity in silica reference materials. https://doi.org/10.1016/j.matlet.2024.136089

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