DOE OSTI · 2585826
High-throughput density characterization of combinatorial thin films using x-ray reflectivity
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Addamane, Sadhvikas Jayachandra, Dorman, Kyle Rhys, Desai, Saaketh, Rodriguez, Mark Andrew, Heile, Jonathan Daniel, Wampler, William R., Dingreville, Remi Philippe Michel, Boyce, Brad Lee, Adams, David P.. 2024-08-01. High-throughput density characterization of combinatorial thin films using x-ray reflectivity. https://doi.org/10.2172/2585826
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