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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 235 records · Page 13
All sourcesNASA NTRSDOE OSTI
NASA NTRS1990

Acquisition and analysis of accelerometer data

Acceleration data reduction must be undertaken with a complete understanding of the physical process, the means by which the data are acquired, and finally, the calculations necessary to put the data into a meaningful format. Discussed here are the acceleration sensor requirements dictated by the measurements desired. Sensor noise, dynamic range, and linearity will be determined from the physical parameters of the experiment. The digitizer requirements are discussed. Here the system from sensor to digital storage medium will be integrated, and rules of thumb for experiment duration, filter response, and number of bits are explained. Data reduction techniques after storage are also discussed. Time domain operations including decimating, digital filtering, and averaging are covered, as well as frequency domain methods, including windowing and the difference between power and amplitude spectra, and simple noise determination via coherence analysis. Finally, an example experiment using the Teledyne Geotech Model 44000 Seismometer to measure from 1 Hz to 10(exp -6) Hz is discussed. The sensor, data acquisition system, and example spectra are presented.

Verges, Keith R.↗
NASA NTRS1993

Micromachined Tunneling Accelerometer

Separation of tunneling electrodes adjusted by varying electrostatic force. Major components of tunneling transducer formed on two silicon chips by microfabrication techniques. Use of electrostatic deflection reduces sensitivity of transducer to thermal drift and simplifies design. Sensitivity suitable for applications in which larger acceleration-sensing instruments required.

Kenny, Thomas W.↗
NASA NTRS1922

Description of the Klemperer wing strain meter (accelerometer)

The wing strain meter enables a pilot to know the strain on lifting surfaces and to warn him of the safe limits which may not be exceeded. In wing strain the most important factors are the force of gravity and the force of lift which gives the measure of the sustaining force, and their components which are perpendicular to the lifting surfaces. This reports methods for using the wing strain meter.

INSTRUMENTS - WING LOAD INDICATORS - KLEMPERER (ZE↗
NASA NTRS1994

High-Storage-Capacity Accelerometer System

Instrumentation system measures and records accelerations at frequencies from 0 to 100 Hz and magnitudes from 10 to the negative 5th power to 0.5 g. Developed to aid research on small accelerations in spacecraft in orbit. Also used on Earth: with modified acceleration sensors to monitor acceleration environments of sensitive products transported by airplanes, railroad trains, trucks, or ships.

Chase, Theodore L.↗
NASA NTRS1994

Smart accelerometer

The invention discloses methods and apparatus for detecting vibrations from machines which indicate an impending malfunction for the purpose of preventing additional damage and allowing for an orderly shutdown or a change in mode of operation. The method and apparatus is especially suited for reliable operation in providing thruster control data concerning unstable vibration in an electrical environment which is typically noisy and in which unrecognized ground loops may exist.

Bozeman, Richard J., Jr.↗
NASA NTRS1997

CCD Video Observation of Microgravity Crystallization of Lysozyme and Correlation with Accelerometer Data

Lysozyme has been crystallized using the ESA Advanced Protein Crystallization Facility onboard the NASA Space Shuttle Orbiter during the IML-2 mission. CCD video monitoring was used to follow the crystallization process and evaluate the growth rate. During the mission some tetragonal crystals were observed moving over distances of up to 200 micrometers. This was correlated with microgravity disturbances caused by firings of vernier jets on the Orbiter. Growth-rate measurement of a stationary crystal (which had nucleated on the growth reactor wall) showed spurts and lulls correlated with an onboard activity; astronaut exercise. The stepped growth rates may be responsible for the residual mosaic block structure seen in crystal mosaicity and topography measurements.

Snell, E. H.↗
NASA NTRS2000

Reconfigurable Flight Control Using Nonlinear Dynamic Inversion with a Special Accelerometer Implementation

This paper presents an approach to on-line control design for aircraft that have suffered either actuator failure, missing effector surfaces, surface damage, or any combination. The approach is based on a modified version of nonlinear dynamic inversion. The approach does not require a model of the baseline vehicle (effectors at zero deflection), but does require feedback of accelerations and effector positions. Implementation issues are addressed and the method is demonstrated on an advanced tailless aircraft. An experimental simulation analysis tool is used to directly evaluate the nonlinear system's stability robustness.

Bacon, Barton J.↗
NASA NTRS1995

State Estimation of Main Rotor Flap and Lead-Lag Using Accelerometers and Laser Transducers on the RASCAL UH-60 Helicopter

Modern rotorcraft flight control system designs which promise to yield high vehicle response bandwidth and good gust rejection can benefit from the use of rotor-state feedbacks. The measurement of main rotor blade motions is also desirable to validate and improve rotorcraft simulation models, to identify high-order linear flight dynamics models, to provide rotor system health monitoring; during flight test, and to provide for correlation with acoustic measurements from wind tunnel and flight tests. However, few attempts have been made to instrument a flight vehicle in this manner, and no previous system has had the robustness and accuracy required for these diverse applications. A rotor blade motion measurement and estimation system has been developed by NASA and the U.S. Army for use on the Rotorcraft Aircrew Systems Concepts Airborne Laboratory (RASCAL) helicopter. RASCAL is a UH-60 Blackhawk which is being modified at Ames Research Center in a phased development program for use in flight dynamics and controls, navigation, airspace management, and rotorcraft human factors research. The aircraft will feature a full-authority, digital, fly-by-wire research flight control system; a coupled ring laser gyro, differential GPS based navigation system; a stereoscopic color wide field of view helmet, mounted display; programmable panel mounted displays; and advanced navigation sensors. The rotor blade motion system is currently installed for data acquisition only, but will be integrated with the research flight control system when it is installed later this year.

Fletcher, Jay W.↗
NASA NTRS2004

Multi-Functional, Micro Electromechanical Silicon Carbide Accelerometer

A method of bulk manufacturing SiC sensors is disclosed and claimed. Materials other than SiC may be used as the substrate material. Sensors requiring that the SiC substrate be pierced are also disclosed and claimed. A process flow reversal is employed whereby the metallization is applied first before the recesses are etched into or through the wafer. Aluminum is deposited on the entire planar surface of the metallization. Photoresist is spun onto the substantially planar surface of the Aluminum which is subsequently masked (and developed and removed). Unwanted Aluminum is etched with aqueous TMAH and subsequently the metallization is dry etched. Photoresist is spun onto the still substantially planar surface of Aluminum and oxide and then masked (and developed and removed) leaving the unimidized photoresist behind. Next, ITO is applied over the still substantially planar surface of Aluminum, oxide and unimidized photoresist. Unimidized and exposed photoresist and ITO directly above it are removed with Acetone. Next, deep reactive ion etching attacks exposed oxide not protected by ITO. Finally, hot phosphoric acid removes the Al and ITO enabling wires to connect with the metallization. The back side of the SiS wafer may be also etched.

Robert S Okojie↗