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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 415 records · Page 23
All sourcesNASA NTRSDOE OSTI
NASA NTRS1991

Pressure vessel burst test program. II

The current status is disucssed of a program to study the characteristics of blast waves and fragmentation generated by ruptured gas-filled pressure vessels. Current methods for assessing vessel safety and burst parameters are briefly reviewed, and pneumatic burst testing operations and testing results are examined. A comparison is made with current methods for burst assessment. It is tentatively concluded that, at close distances, vessel burst overpressures are less than those of high-explosive (HE) blasts with equivalent energy and are greater than HE far from the vessel. The impulse appears to be the same for both vessel bursts and equivalent energy HE blasts. The functional relationship between shock velocity and overpressure ratio appears to be the same for vessel bursts as for HE blasts. The initial shock overpressure appears to be much less than vessel pressure and may be found using the one-dimensional shock tube equation.

Cain, Maurice R.↗
NASA NTRS1983

Ascent air data system results from the space shuttle flight test program

The ascent air data system of the Space Shuttle consists of a simple biconic spike probe on the nose of the external tank. Pressure measurements were calibrated in a wind tunnel to obtain vehicle attitude and speed (relative to the air) and dynamic pressure. The wind tunnel test data analysis and the calibration are discussed in terms of test problems and calibration parameter formulation. The flight pressures are traced from telemetry data to final air data products. Analysis of the flight results showed that static pressure could not be accurately determined at the higher Mach numbers (above approx. 2.0). By replacing static pressure with data from a postflight estimated trajectory the ascent air data system performance met the user requirements. Lessons learned are enumerated, the most important being the need for a thorough systems integration effort.

Hillje, E. R.↗
NASA NTRS1986

Test program to provide confidence in liquid oxygen cooling of hydrocarbon fueled rocket thrust chambers

An experimental program has been planned at the NASA Lewis Research Center to build confidence in the feasibility of liquid oxygen cooling for hydrocarbon fueled rocket engines. Although liquid oxygen cooling has previously been incorporated in test hardware, more runtime is necessary to gain confidence in this concept. In the previous tests, small oxygen leaks developed at the throat of the thrust chamber and film cooled the hot-gas side of the chamber wall without resulting in catastrophic failure. However, more testing is necessary to demonstrate that a catastrophic failure would not occur if cracks developed further upstream between the injector and the throat, where the boundary layer has not been established. Since under normal conditions cracks are expected to form in the throat region of the thrust chamber, cracks must be initiated artificially in order to control their location. Several methods of crack initiation are discussed in this report. Four thrust chambers, three with cracks and one without, should be tested. The axial location of the cracks should be varied parametrically. Each chamber should be instrumented to determine the effects of the cracks, as well as the overall performance and durability of the chambers.

Armstrong, E. S.↗
NASA NTRS1979

Diode step stress testing program for JANTX1N3031B

The effect of power/temperature step stress when applied to the zener diode JANTX1N3031B manufactured by Siemens and Motorola is reported. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control sample units were maintained for verification of the electrical parametric testing.

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NASA NTRS1979

Transistor step stress testing program for JANTX2N2369A

The effect is reported of power/temperature step stress when applied to the transistor JANTX2N2369A manufactured by Raytheon and National Semiconductor. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control sample units were maintained for verification of the electrical parametric testing. The power/thermal stress tests are described, and failure analyses are presented.

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NASA NTRS1994

Program test objectives milestone 3

The following conclusions have been developed relative to propulsion system technology adequacy for efficient development and operation of recoverable and expendable launch vehicles (RLV and ELV) and the benefits which the integrated propulsion technology demonstrator will provide for enhancing technology: (1) Technology improvements relative to propulsion system design and operation can reduce program cost. Many features or improvement needs to enhance operability, reduce cost, and improve payload are identified. (2) The Integrated Propulsion Technology Demonstrator (IPTD) Program provides a means of resolving the majority of issues associated with improvement needs. (3) The IPTD will evaluate complex integration of vehicle and facility functions in fluid management and propulsion control systems, and provides an environment for validating improved mechanical and electrical components. (4) The IPTD provides a mechanism for investigating operational issues focusing on reducing manpower and time to perform various functions at the launch site. These efforts include model development, collection of data to validate subject models, and ultimate development of complex time line models. (5) The IPTD provides an engine test bed for tri/bi-propellant engine development firings which is representative of the actual vehicle environment. (6) The IPTD provides for only a limited multiengine configuration integration environment for RLV. Multiengine efforts may be simulated for a number of subsystems and a number of subsystems are relatively independent of the multiengine influences.

Gaynor, T. L.↗
NASA NTRS1979

Transistor step stress testing program for JANTX2N2905A

The effect of power/temperature step stress when applied to the transistor JANTX2N2905A manufactured by Texas Instruments and Motorola is reported. A total of 48 samples from each manufacturer was submitted to the process outlined. In addition, two control sample units were maintained for verification of the electrical parametric testing. All test samples were subjected to the electrical tests outlined in Table 2 after completing the prior power/temperature step stress point.

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NASA NTRS1979

Transistor step stress testing program for JANTX2N4856

The effect of power/temperature step stress when applied to a field effect transistor JANTX2N4856 manufactured by Texas Instruments and Teledyne was evaluated. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control units were maintained for verification of the electrical parametric testing.

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NASA NTRS1979

Diode step stress testing program for JANTX1N2989B

The effect of power/temperature step stress when applied to the zener diode JANTX2N2989 manufactured by Siemens and General Semiconductor is reported. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control sample units were maintained for verification of the electrical parameteric testing.

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NASA NTRS1979

Diode step stress testing program for JANTX1N5618

The effect of power/temperature step stress when applied to the switching diode JANTX1N5618 manufactured by Semtech and Micro Semiconductor is reported. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control sample units were maintained for verification of the electrical parametric testing.

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NASA NTRS1947

Data Obtained in the Flight Measurements to Determine the Stability and Control Characteristics of a C-54D Airplane (AAF No. 42-72713) and a Summary of the Test Program

The flight investigation of the C-54D airplane was initiated to determine the necessity of changes or additions to existing handling-qualities requirements to cove the case of instrument approaches with large airplanes. This paper gives a brief synopsis of the results and presents the measured data of tests to determine the stability and control characteristics. It was found that no new requirements were necessary to cover the problems of instrument approaches. The C-54D airplane tested met the Amy and Navy stability and control requirements except for the following items. The control-system friction with autopilot installed vas double that allowed by the requirements. The amount of friction was found to impair the controllability of the airplane in precision flying. The lateral and directional characteristics were good except that the maximum pb/2V was slightly below the minimum required, and the elevator-control forces to obtain the maximum pb/2V at low speeds were above the Army and Navy requirements. The longitudinal stability and control characteristics were good except that the elevator-control forces exceeded the limits of the Army and Navy requirements in turns and in landings. The stalling characteristics were considered good in all conditions with the stall warning in the form of tail buffeting occurring at speeds approximately 5 miles per hour above the stall.

Talmage, Donald B.↗
NASA NTRS1979

Diode step stress testing program for JANTX1N3016B

The effect of power/temperature step stress when applied to a variety the zener diode JANTX2N3016B manufactured by Siemens and Motorola is reported. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control sample units were maintained for verification of the electrical parametric testing.

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NASA NTRS1979

Transister step stress testing program for JANTX2N3811

The effect was studied of power/temperature step stress when applied to the dual transistor JANTX2N3811 manufactured by Motorola and National Semiconductor. A total of 48 samples from Motorola and 47 from National Semiconductor was submitted to the processes. In addition, two control sample units were maintained for verification of the electrical parametric testing. The tests for determining power/temperature stresses are described, and test results are discussed. Failure analyses for power stress, and temperature stress are presented.

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NASA NTRS1979

Transistor step stress testing program for JANTX2N2484

The effect of power/temperature step stress when applied to the transistor JANTX2N2484, manufactured by Raytheon and Teledyne was evaluated. Forty-eight samples from each manufacturer were divided equally (16 per group) into three groups and submitted to the processes outlined. In addition, two control sample units were maintained for verification of the electrical parametric testing.

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NASA NTRS1988

Mast material test program (MAMATEP)

The MAMATEP program, which is aimed at verifying the need for and evaluating the performance of various protection techniques for the solar array assembly mast of the Space Station photovoltaic power module, is discussed. Coated and uncoated mast material samples have been environmentally tested and evaluated, before and after testing, in terms of mass and bending modulus. The protective coatings include CV-1144 silicone, a Ni/Al/InSn eutectic, and an open-weave Al braid. Long-term plasma asher results from unprotected samples indicate that, even though fiberglass-epoxy samples degrade, a protection technique may not be necessary to ensure structural integrity. A protection technique, however, may be desirable to limit or contain the amount of debris generated by the degradation of the fiberglass-epoxy.

Ciancone, Michael L.↗
NASA NTRS1979

Diode step stress testing program for JANTX1n5420

Data compiled for the purpose of evaluating the effect of power/temperature step stress when applied to the diode JANTX1N5420 manufactured by Unitrode and Micro-Semiconductor is presented. A total of 48 samples from each manufacturer was submitted to the processes outlined. In addition, two control sample units were maintained for verification of the electrical parametric testing.

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NASA NTRS2013

Summary of the 2012 Inductive Pulsed Plasma Thruster Development and Testing Program

Inductive pulsed plasma thrusters are spacecraft propulsion devices in which energy is capacitively stored and then discharged through an inductive coil. While these devices have shown promise for operation at high efficiency on a range of propellants, many technical issues remain before they can be used in flight applications. A conical theta-pinch thruster geometry was fabricated and tested to investigate potential improvements in propellant utilization relative to more common, flat-plate planar coil designs. A capacitor charging system is used to permit repetitive discharging of thrusters at multiple cycles per second, with successful testing accomplished at a repetition-rate of 5 Hz at power levels of 0.9, 1.6, and 2.5 kW. The conical theta-pinch thruster geometry was tested at cone angles of 20deg, 38deg, and 60deg, with single-pulse operation at 500 J/pulse and repetitionrate operation with the 38deg model quantified through direct thrust measurement using a hanging pendulum thrust stand. A long-lifetime valve was designed and fabricated, and initial testing was performed to measure the valve response and quantify the leak rate at beginning-of-life. Subscale design and testing of a capacitor charging system required for operation on a spacecraft is reported, providing insights into the types of components needed in the circuit topology employed. On a spacecraft, this system would accept as input a lower voltage from the spacecraft DC bus and boost the output to the high voltage required to charge the capacitors of the thruster.

Polzin, K. A.↗
NASA NTRS1985

Space test program of high-voltage solar array-space plasma interactions

Future spacecraft, notably the proposed Space Station, will require power systems much larger than have previously been flown. It is recognized that at higher voltages, and at the relatively high plasma density present at low Earth orbital altitudes, undesirable interactions between the high voltage solar array and the space plasma will occur. Space experiments on high voltage solar array space plasma interactions in low Earth orbit are an absolute requirement for confident design of a higher voltage solar array. Experiments are presently being identified to provide the necessary space data for calibration of ground testing, validation of analytical models, and development of design guidelines required for confident design of high voltage solar arrays in space. A proposed flight experiment program which is designed to obtain the required data is summarized.

Carruth, M. R., Jr.↗