NASA NTRS · 20000088610
Radiation Damage and Single Event Effect Results for Candidate Spacecraft Electronics
Abstract
We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy-ion induced single-event effects and proton-induced damage. We also present data on the susceptibility of parts to functional degradation resulting from total ionizing dose at low dose rates (0.003-0.33 Rads(Si)/s). Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, Analog to Digital Converters (ADCs), Digital to Analog Converters (DACs), and DC-DC converters, among others.
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OBryan, Martha V., LaBel, Kenneth A., Reed, Robert A., Howard, James W., Jr., Ladbury, Ray L., Barth, Janet L., Kniffin, Scott D., Seidleck, Christina M., Marshall, Paul W., Marshall, Cheryl J., Day, John H.. 2000-01-01. Radiation Damage and Single Event Effect Results for Candidate Spacecraft Electronics. https://ntrs.nasa.gov/citations/20000088610
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