NASA NTRS · 20090027717
Low-Energy Proton Testing Methodology
Abstract
Use of low-energy protons and high-energy light ions is becoming necessary to investigate current-generation SEU thresholds. Systematic errors can dominate measurements made with low-energy protons. Range and energy straggling contribute to systematic error. Low-energy proton testing is not a step-and-repeat process. Low-energy protons and high-energy light ions can be used to measure SEU cross section of single sensitive features; important for simulation.
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Pellish, Jonathan A., Marshall, Paul W., Heidel, David F., Schwank, James R., Shaneyfelt, Marty R., Xapsos, M.A., Ladbury, Raymond L., LaBel, Kenneth A., Berg, Melanie, Kim, Hak S., Phan, Anthony, Friendlich, M.R., Rodbell, Kenneth P., Hakey, Mark C., Dodd, Paul E., Reed, Robert A., Weller, Robert A., Mendenhall, Marcus H., Sierawski, B.D.. 2009-04-20. Low-Energy Proton Testing Methodology. https://ntrs.nasa.gov/citations/20090027717
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