NASA NTRS · 20210012116
Evaluating Elevated Temperature DRAM Stuck Bit Sensitivity at Room Temperature
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Sheldon, Douglas J., Allen, Gregory R., Vanacore, Joseph, Blaisdell-Pijuan, Paris, Delaney, Sam W., Nguyen, Duc N., Parker, Wilson P., Guertin, Steven M.. 2019-07-08. Evaluating Elevated Temperature DRAM Stuck Bit Sensitivity at Room Temperature. https://ntrs.nasa.gov/citations/20210012116
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