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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 379 records · Page 21

Testing of Candidate Rigid Heatshield Materials at LHMEL for the Entry, Descent, and Landing Technology Development Project

The material testing results described in this paper were part of a material development program of vendor-supplied, proposed heat shield materials. The goal of this program was to develop low density, rigid material systems with an appreciable weight savings over phenolic-impregnated carbon ablator (PICA) while improving material response performance. New technologies, such as PICA-like materials in honeycomb or materials with variable density through-the-thickness were tested. The material testing took place at the Wright-Patterson Air Force Base Laser Hardened Materials Laboratory (LHMEL) using a 10.6 micron CO2 laser operating with the test articles immersed in a nitrogen-gas environment at 1 atmosphere pressure. Test measurements included thermocouple readings of in-depth temperatures, pyrometer readings of surface temperatures, weight scale readings of mass loss, and sectioned-sample readings of char depth. Two laser exposures were applied. The first exposure was at an irradiance of 450 W/cm2 for 50 or 60 seconds to simulate an aerocapture maneuver. The second laser exposure was at an irradiance of 115 W/cm2 for 100 seconds to simulate a planetary entry. Results from Rounds 1 and 2 of these screening tests are summarized.

Sepka, Steven↗

Proton-induced noise in digicons

The Space Telescope, which carries four Digicons, will pass several times per day through a low-altitude portion of the radiation belt called the South Atlantic Anomaly. This is expected to create interference in what is otherwise anticipated to be a noise-free device. Two essential components of the Digicon, the semiconductor diode array and the UV transmitting window, generate noise when subjected to medium-energy proton radiation, a primary component of the belt. These trapped protons, having energies ranging from 2 to 400 Mev and fluences at the Digicon up to 4,000 P+/sec-sq cm, pass through both the window and the diode array, depositing energy in each. In order to evaluate the effect of these protons, engineering test models of Digicon tubes to be flown on the High Resolution Spectrograph were irradiated with low-flux monoenergetic proton beams at the University of Maryland cyclotron. Electron-hole pairs produced by the protons passing through the diodes or the surrounding bulk caused a background count rate. This is the result of holes diffusing over a distance of many diode spacings, causing counts to be triggered simultaneously in the output circuits of several adjacent diodes. Pulse-height spectra of these proton-induced counts indicate that most of the bulk-related counts overlap the single photoelectron peak. A geometrical model will be presented of the charge collection characteristics of the diode array that accounts for most of the observed effects.

Smith, L. C.↗

Micron MT29F128G08AJAAA 128GB Asynchronous Flash Memory Total Ionizing Dose Characterization Test Report

The purpose of this test was to characterize the Micron MT29F128G08AJAAAs parameter degradation for total dose response and to evaluate and compare lot date codes for sensitivity. In the test, the device was exposed to both low dose and high dose rate (HDR) irradiations using gamma radiation. Device parameters such as leakage currents, quantity of upset bits and overall chip and die health were investigated to determine which lot is more robust.

Flash Memory↗

Heavy Ion Testing at the Galactic Cosmic Ray Energy Peak

A 1 GeV/u 5 6Fe ion beam allows for true 90deg tilt irradiations of various microelectronic c-0mponents and reveals relevant upset trends at the GCR Hux energy peak. Three SRAMs and an SRAM-based FPGA evaluated at the NASA Space Radiation Effects Laboratory demonstrate that a 90deg tilt irradiation yields a unique device response. These tilt angle effects need t-0 be screened for, and if found, pursued with radiation transport simulations to quantify their impact on event rate calculations.

Pellish, Jonathan A.↗

ISSI IS46DR16640B-25DBA25 DDR2 SDRAM Total Ionizing Dose Characterization Test Report

The purpose of this testing is to characterize the ISSI IS46DR16640B-25DBA25 parameter degradation for total dose response. This test’s purpose is to evaluate and compare lot date codes for sensitivity. In the test, the device is exposed to both low dose and high dose rate (HDR) irradiations using gamma radiation. Device parameters such as leakage currents, quantity of upset bits or addresses, and overall chip and die health are investigated to determine which lot is more robust. These parameters directly affect the functionality of the memory within a system and may determine thresholds necessary to mitigate failure.

Total Ionizing Dose (TID)↗

Schottky Diode Derating for Survivability in a Heavy Ion Environment

In this paper, we irradiate a number of silicon power Schottky diodes from a variety of manufacturers. The tested diodes represent a wide assortment of reverse voltages and forward currents. Additionally, we review correlations between single-event failures in Schottky diodes and device electrical parameters. The spatial locations of failures in the diode are discussed, as well as a possible explanation for why the failures occur. Based on these correlations to date, we propose a derating scheme for Schottky diodes flown in a heavy ion environment and suggest screening procedures for decreasing the risks of such failures.

Radiation effects↗

PE99155 Point-Of-Load Buck Regulator Total Ionizing Dose Test Report

Teledyne’s PE99155 point-of-load buck regulator was tested to evaluate an applicationspecific question about the start-up behavior of the device. This test determined if accumulated total ionizing dose (TID) affected any start-up voltage transient characteristics. Testing was based on pass/fail criterial for the magnitude of the output voltage to ensure the safety of downstream electronics. Two sets of radiation tests were performed. The first group of PE99155s used a high dose rate (HDR) irradiation to 25 krad(Si). A second group of PE99155s used high dose rate irradiation to 30 krad(Si).

TID↗

Heavy Ion Testing at the Galactic Cosmic Ray Energy Peak

A 1 GeV/u Fe-56 Ion beam allows for true 90 deg. tilt irradiations of various microelectronic components and reveals relevant upset trends for an abundant element at the galactic cosmic ray (GCR) flux-energy peak.

Pellish, Jonathan A.↗

Pulsed source of energetic atomic oxygen

A pulsed high flux source of nearly monoenergetic atomic oxygen was designed, built, and successfully demonstrated. Molecular oxygen at several atmospheres pressure is introduced into an evacuated supersonic expansion nozzle through a pulsed molecular beam valve. An 18 J pulsed CO2 TEA laser is focused to intensities greater than 10(9) W/sq cm in the nozzle throat to generate a laser-induced breakdown. The resulting plasma is heated in excess of 20,000 K by a laser supported detonation wave, and then rapidly expands and cools. Nozzle geometry confines the expansion to provide rapid electron-ion recombination into atomic oxygen. Average O atom beam velocities from 5 to 13 km/s were measured at estimated fluxes to 10(18) atoms per pulse. Preliminary materials testing has produced the same surface oxygen enrichment in polyethylene samples as obtained on the STS-8 mission. Scanning electron microscope examinations of irradiated polymer surfaces reveal an erosion morphology similar to that obtained in low Earth orbit, with an estimated mass removal rate of approx. 10(-24) cu cm/atom. The characteristics of the O atom source and the results of some preliminary materials testing studies are reviewed.

Caledonia, George E.↗

Detector Based Calibration of a Portable Imaging Spectrometer for CLARREO Pathfinder Mission

The Climate Absolute Refractivity and Reflectance Observatory (CLARREO) Pathfinder (CPF) mission is being developed to demonstrate SI-traceable retrievals of reflectance at unprecedented accuracies for global satellite observations. An Independent Calibration of the CPF sensor using the Goddard Laser for Absolute Measurement of Radiance (GLAMR) is planned to allow validation of CPF accuracies. GLAMR is a detector-based calibration system relies on a set of NIST-calibrated transfer radiometers to assess the spectral radiance from the GLAMR sphere source to better than 0.3 % (k=2). The current work describes the calibration of the Solar, Lunar Absolute Reflectance Imaging Spectroradiometer (SOLARIS) that was originally developed as a calibration demonstration system for the CLARREO mission and is now being used to assess the independent calibration being developed for CPF. The methodology for the radiometric calibration of SOLARIS is presented as well as results from the GLAMR-based calibration of SOLARIS. The portability of SOLARIS makes it capable of collecting field measurements of earth scenes and direct solar and lunar irradiance similar to those expected during the on-orbit operation of the CPF sensor. Results of SOLARIS field measurements are presented. The use of SOLARIS in this effort also allows the testing protocols for GLAMR to be improved and the field measurements by SOLARIS build confidence in the error budget for GLAMR calibrations. Results are compared to accepted solar irradiance models to demonstrate accuracy values giving confidence in the error budget for the CLARREO reflectance retrieval.

Aytac, Yigit↗

The effects of radiation on the outer planets grand tour

A handbook is presented which was designed to accompany an oral presentation on the effects of radiation on the outer planets grand tour (OPGT). A summary of OPGT radiation environments expected from natural sources and the radioisotope thermoelectric generators and basic radiation effects and processes are reviewed, and ionization and displacement effects are examined. The presentation summarizes the effects of radiation on miscellaneous spacecraft materials and devices. The annealing and hardening of electronics are described. Special emphasis is placed on microcircuits. Mathematical modeling of circuits affected by radiation and radiation environmental testing are discussed. A review of means of evaluating the performance and correcting failures of irradiated devices is also presented.

Source record↗

Effects of low earth orbit on the optical performance of multi-layer enhanced high reflectance mirrors

Two mirror designs developed for space applications were flown along with a standard mid-infrared design on the leading and trailing edges of the Long Duration Exposure Facility (LDEF). Preliminary observations of induced changes in optical performance of ZnS-coated mirrors and impact-related microstructural and microchemical effects are described in the proceedings of the First LDEF Post-Retrieval Symposium. In this paper, effects of the induced environment and meteoroid/debris impacts on mirror performance are described in more detail. Also, an analysis of reflectance spectra using the results of Auger and secondary ion mass spectroscopy (SIMS) profiling measurements are used to identify an optical-degradation mechanism for the ZnS-coated mirrors. Structural damage associated with a high-velocity impact on a (Si/Al2O3)-coated mirror was imaged optically and with scanning electron and atomic force microscopy (SEM and AFM). Scanning Auger and SIMS analysis provided chemical mapping of selected impact sites. The impact data suggest design and fabrication modifications for obtaining improved mechanical performance using a design variation identified in preflight laboratory simulations. Auger surface profile and SIMS imaging data verified the conclusion that secondary impacts are the source of contamination associated with the dendrites grown on the leading-edge ZnS-coated test samples. It was also found that dendrites can be grown in the laboratory by irradiating contaminated sites on a trailing-edge ZnS-coated sample with a rastered electron beam. These results suggest a mechanism for dendrite growth.

Donovan, Terence↗

Effects of Electrons, Protons, and Ultraviolet Radiation on Thermophysical Properties of Polymeric Films

The response of coated thin polymer films to ultraviolet (UV), electron and proton radiation simultaneously has been evaluated, with selected measurements in situ. Exposure was intended to simulate the electron and proton radiation environment near the Earth-Sun Lagrangian points (LI and L2) for five years and approximately 1000 equivalent solar hours (ESH) UV. These orbital environments are relevant to several potential missions such as the Next Generation Space Telescope and Geomagnetic Storm Warning, both of which may use thin film based structures for a sunshade and solar sail, respectively. The thin film candidates (12.5 micrometers thick) consisted of commercially available materials (Kapton(R) E, HN, Upilex(R) S, CP-1, CP-2, TOR-RC, and TOR-LMBP) that were metalized on one side with vapor deposited aluminum. All of the films are aromatic polyimides, with the exception of TORLMBP, which is a copoly(arylene ether benzimidazole). The films were exposed as second surface mirrors and the effects of the exposure on solar absorptance, thermal emittance, and tensile properties were determined. The in situ changes in solar absorptance from Kapton(R) and Upilex(R) were less than 0. 1, whereas the solar absorptance of TOR and CP films increased by more than 0.3 without saturating. The thermal emittance measurements also showed that the Kapton(R) and Upilex(R) materials increased only 1-2%, but the remaining materials increased 5-8%. Based on tensile property measurements made in air following the test, the failure stress of every type of polymer film decreased as a result of irradiation. The polymers most stable in reflectance, namely Upilex(R) and Kapton(R), were also the strongest in tension before irradiation, and they retained the greatest percentage of tensile strength. The films less stable in reflectance were also weaker in tension, and lost more tensile strength as a result of irradiation. The apparent failure strain (as a percent of original gage length) of every type of polymer film except TOR-RC, decreased as a result of irradiation.

Russell, Dennis A.↗

Radiation Tests on 2Gb NAND Flash Memories

We report on SEE and TID tests of highly scaled Samsung 2Gbits flash memories. Both in-situ and biased interval irradiations were used to characterize the response of the total accumulated dose failures. The radiation-induced failures can be categorized as followings: single event upset (SEU) read errors in biased and unbiased modes, write errors, and single-event-functional-interrupt (SEFI) failures.

NAND circuits↗