NASA NTRS · 20180000086
Heavy Ion Testing at the Galactic Cosmic Ray Energy Peak
Abstract
A 1 GeV/u 5 6Fe ion beam allows for true 90deg tilt irradiations of various microelectronic c-0mponents and reveals relevant upset trends at the GCR Hux energy peak. Three SRAMs and an SRAM-based FPGA evaluated at the NASA Space Radiation Effects Laboratory demonstrate that a 90deg tilt irradiation yields a unique device response. These tilt angle effects need t-0 be screened for, and if found, pursued with radiation transport simulations to quantify their impact on event rate calculations.
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Pellish, Jonathan A., Xapsos, Michael A., LaBel, Kenneth A., Marshall, Paul W., Heidel, David F., Rodbell, Kennth P., Hakey, Mark C., Dodd, Paul E., Shanneyfelt, Marty R., Schwank, James R., Baumann, Robert C., Deng, Xiaowei, Marshall, Andrew, Sierawski, Brian D., Black Jeffrey D., Reed, Robert A., Schrimpf, Ronald D., Kim, Hak S., Berg, Melanie D., Campola, Michael J., Friendlich, Mark R., Perez, Christopher E., Phan, Anthony M., Seidleck, Christina M.. 2009-09-11. Heavy Ion Testing at the Galactic Cosmic Ray Energy Peak. https://ntrs.nasa.gov/citations/20180000086
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