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Search indexed NASA NTRS and DOE OSTI research on propulsion, heat transfer, battery materials and energy systems. Follow report and document links to the original sources.

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At least 91 records · Page 5
All sourcesNASA NTRSDOE OSTI
DOE OSTI2026

Fermilab PIP II machine protection system digitized data noise elimination scheme and its FPGA implementation

In Fermilab's PIP-II machine protection system, beam loss signals from various detectors are digitized at 125 MS/s. Noise from both high-frequency sources and low-frequency 60 Hz AC power equipment can contaminate the data. To suppress noise across these ranges especially 60 Hz and its harmonics, which overlap with beam loss signal frequencies advanced digital processing beyond standard filtering is required. Several real-time functional blocks were simulated and tested on an FPGA: (1) a dual time-constant discharging integrator filter, (2) a de-ripple baseline extraction and storage block, and (3) a fast-recovery discharging integrator. The nonlinear IIR integrator filter removes high-frequency noise and feeds into the baseline extractor. Upon detecting abrupt beam loss, it switches to a longer time constant to prevent baseline distortion. The de-ripple block calculates a valid baseline by averaging over multiple 60 Hz periods, storing results in a 4096-word FPGA RAM. This baseline is subtracted from raw data before integration by the fast-recovery block, which resets quickly after use. All blocks achieved expected performance.

Wu, J. [Fermilab] (ORCID:0000000344329521)↗
DOE OSTI2026

A Complexity Agnostic Clustering Engine for Time Projection Chambers and its Implementation in FPGA

A clustering functional block implemented in field-programable-gate-array (FPGA) for time projection chambers (TPC) operating with predictable time regardless the complexity of the event is described in this paper. The clustering functional block reorganizes input data and the hits data belonging to the same clusters are output together for further process in the later stages. The clustering operation consists of two phases, data filling phase and data outputting phase, and the later uses the same number of clock cycles as the data filling phase. The clustering block can accommodate events with arbitrary number of clusters and number of hits per cluster as long as the total number of hits is within a predesigned limit. The operation time is exactly twice of the data filling time with no residual O(n2) term. The clustering block has been implemented with operating frequency of 200 MHz in a low-cost FPGA evaluation module and test results confirm the expected performance.

Wu, Jinyuan [Fermilab] (ORCID:0000000344329521)↗
DOE OSTI2024

Entropy Analysis of FPGA Interconnect and Switch Matrices for Physical Unclonable Functions

Random variations in microelectronic circuit structures represent the source of entropy for physical unclonable functions (PUFs). In this paper, we investigate delay variations that occur through the routing network and switch matrices of a field-programmable gate array (FPGA). The delay variations are isolated from other components of the programmable logic, e.g., look-up tables (LUTs), flip-flops (FFs), etc., using a feature of Xilinx FPGAs called dynamic partial reconfiguration (DPR). A set of partial designs is created to fix the placement of a time-to-digital converter (TDC) and supporting infrastructure to enable the path delays through the target interconnect and switch matrices to be extracted by subtracting out common-mode delay components. Delay variations are analyzed in the different levels of routing resources available within FPGAs, i.e., local routing and across-chip routing. Data are collected from a set of Xilinx Zynq 7010 devices, and a statistical analysis of within-die variations in delay through a set of the randomly-generated and hand-crafted interconnects is presented.

97 MATHEMATICS AND COMPUTING↗
NASA NTRS2002

Single event upset susceptibility testing of the Xilinx Virtex II FPGA

Heavy ion testing of the Xilinx Virtex IZ was conducted on the configuration, block RAM and user flip flop cells to determine their single event upset susceptibility using LETs of 1.2 to 60 MeVcm^2/mg. A software program specifically designed to count errors in the FPGA is used to reveal L1/e values and single-event-functional interrupt failures.

FPGA Xilinx Virtex static test single event upset↗
NASA NTRS2002

Single event upset suspectibility testing of the Xilinx Virtex II FPGA

Heavy ion testing of the Xilinx Virtex II was conducted on the configuration, block RAM and user flip flop cells to determine their static single-event upset susceptibility using LETs of 1.2 to 60 MeVcm^2/mg. A software program specifically designed to count errors in the FPGA was used to reveal L1/e, values (the LET at which the cross section is l/e times the saturation cross-section) and single-event functional-interrupt failures.

FPGA Virtex II SEU↗
NASA NTRS2008

Implementing Legacy-C Algorithms in FPGA Co-Processors for Performance Accelerated Smart Payloads

Accurate, on-board classification of instrument data is used to increase science return by autonomously identifying regions of interest for priority transmission or generating summary products to conserve transmission bandwidth. Due to on-board processing constraints, such classification has been limited to using the simplest functions on a small subset of the full instrument data. FPGA co-processor designs for SVM1 classifiers will lead to significant improvement in on-board classification capability and accuracy.

co-processor↗
NASA NTRS2014

Single Event Analysis and Fault Injection Techniques Targeting Complex Designs Implemented in Xilinx-Virtex Family Field Programmable Gate Array (FPGA) Devices

An informative session regarding SRAM FPGA basics. Presenting a framework for fault injection techniques applied to Xilinx Field Programmable Gate Arrays (FPGAs). Introduce an overlooked time component that illustrates fault injection is impractical for most real designs as a stand-alone characterization tool. Demonstrate procedures that benefit from fault injection error analysis.

Single Event Upset Testing↗
NASA NTRS2015

Single Event Effects in FPGA Devices 2014-2015

This presentation provides an overview of single event effects in FPGA devices 2014-2015 including commercial Xilinx V5 heavy ion accelerated testing, Xilinx Kintex-7 heavy ion accelerated testing. Mitigation study, and investigation of various types of triple modular redundancy (TMR) for commercial SRAM based FPGAs.

Single event upset (SEU)↗
NASA NTRS2016

Single Event Effects in FPGA Devices 2015-2016

This presentation provides an overview of single event effects in FPGA devices 2015-2016 including commercial Xilinx V5 heavy ion accelerated testing, Xilinx Kintex-7 heavy ion accelerated testing, mitigation study, and investigation of various types of triple modular redundancy (TMR) for commercial SRAM based FPGAs.

Xilinx V5↗
NASA NTRS2016

Single Event Effects in FPGA Devices 2015-2016

This presentation provides an overview of single event effects in FPGA devices 2015-2016 including commercial Xilinx V5 heavy ion accelerated testing, Xilinx Kintex-7 heavy ion accelerated testing. Mitigation study, and investigation of various types of triple modular redundancy (TMR) for commercial SRAM based FPGAs.

Single Event Upset (SEU) Testing↗
NASA NTRS2018

NASA Electronic Parts and Packaging (NEPP) Field Programmable Gate Array (FPGA) Single Event Effects (SEE) Test Guideline Update

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic versus mission specific device evaluation, single event latch-up (SEL) test and analysis, SEE response visibility enhancement during radiation testing, mitigation evaluation (embedded and user-implemented), unreliable design and its affects to SEE Data, testing flushable architectures versus non-flushable architectures, intellectual property core (IP Core) test and evaluation (addresses embedded and user-inserted), heavy-ion energy and linear energy transfer (LET) selection, proton versus heavy-ion testing, fault injection, mean fluence to failure analysis, and mission specific system-level single event upset (SEU) response prediction. Most sections within the guidelines manual provide information regarding best practices for test structure and test system development. The scope of this manual addresses academic versus mission specific device evaluation and visibility enhancement in IP Core testing.

Test guidelines↗
DOE OSTI2024

Embedded FPGA developments in 130 nm and 28 nm CMOS for machine learning in particle detector readout

Embedded field programmable gate array (eFPGA) technology allows the implementation of reconfigurable logic within the design of an application-specific integrated circuit (ASIC). This approach offers the low power and efficiency of an ASIC along with the ease of FPGA configuration, particularly beneficial for the use case of machine learning in the data pipeline of next-generation collider experiments. An open-source framework called "FABulous" was used to design eFPGAs using 130 nm and 28 nm CMOS technology nodes, which were subsequently fabricated and verified through testing. The capability of an eFPGA to act as a front-end readout chip was assessed using simulation of high energy particles passing through a silicon pixel sensor. A machine learning-based classifier, designed for reduction of sensor data at the source, was synthesized and configured onto the eFPGA. A successful proof-of-concept was demonstrated through reproduction of the expected algorithm result on the eFPGA with perfect accuracy. Finally, further development of the eFPGA technology and its application to collider detector readout is discussed.

47 OTHER INSTRUMENTATION↗
DOE OSTI2025

ESnet-JLab FPGA Accelerated Transport (control plane) [EJFAT (udplbd2)] v2.0

The ESnet-JLab FPGA Accelerated Transport system is a solution for streaming high-speed scientific measurement data from Data Acquisition Systems (DAQs) to high-performance computing facilties. It is generally compatible with many science workflows, and makes no assumptions about the specifics of any particular experiment. This program (udplbd version 2) implements the control plane for the system. It is responsible for programming network forwarding rules into the data plane (implemented by the hardware designed named udplb, described separately). It also implements the control loop necessary to match up offered workload with available capacity on high-performance compute nodes.

Howard, Derek [Lawrence Berkeley National Laborato↗
DOE OSTI2025

Extinction Monitoring of Pulsed Proton Beams Using FPGA-Based Peak Detection

The Mu2e experiment at Fermilab imposes stringent requirements on the elimination of out-of-time beam in its pulsed proton beam - a requirement known as "extinction". We present a method to measure the out-of-time particle rates to calculate the level of extinction in the inter-pulse gaps. The proposed method utilizes an array of quartz Cherenkov radiators and photomultiplier tubes to detect particles scattered from a vacuum chamber in the M4 transfer beamline at Fermilab.The measurement will employ a new μTCA-based FPGA system for data acquisition and signal processing, utilizing real-time peak detection algorithms to count scattered beam particles. By integrating data over many transfers, the time profile of the out-of-time beam will be resolved to fractional levels relative to that of the in-time beam. These results are compared with G4beamline simulations to validate models of beam transport, dynamics, and extinction, providing critical input for optimizing beam delivery to Mu2e.

Hensley, Ryan [UC, Davis]↗
DOE OSTI2026

Calculating beam extinction in a pulsed proton beam using FPGA-based peak detection

The Mu2e experiment at Fermilab imposes stringent requirements on the elimination of out-of-time beam in its pulsed proton beam, a requirement known as “extinction”. Utilizing a new μTCA-based FPGA data acquisition system, we recorded live particle data from scattered particles incident on an array of quartz Cherenkov radiators and photomultiplier tubes to measure the extinction in the inter-pulse gaps in the pulsed proton beam. Minuscule errors in the derived signal period can make a measurement of the extinction impossible, so after taking a Fourier transform, further optimizations on the period were done based on the assumption that the signal period is stable over the full time of the beam spill while it is being resonantly extracted. After these optimizations, the beam extinction was shown to be on the level of 10^3.

Hensley, Ryan [UC, Davis]↗
DOE OSTI2025

FPGA-Based Spill Regulation System for the Muon Delivery Ring at Fermilab

The Muon to Electron Experiment (Mu2e) requires a uniform beam profile from the Muon Delivery Ring to meet their experimental needs. A specialized Spill Regulation System (SRS) has been developed to help achieve consistent spill uniformity. The system is based on a custom-designed carrier board featuring an Arria 10 SoC, capable of executing real-time feedback control. The FPGA processes beam pulses of approximately 200 ns every 1.695 $μ$s, allowing for continuous monitoring of the extracted spill intensity through fast bunch integration. The system directly controls three quadrupole magnets, which work in conjunction with sextupole magnets to achieve third-order resonant extraction. Furthermore, the board interfaces with Fermilab's Accelerator Control Network (ACNET), enabling operators to modify spill regulation settings in real-time via the control network while providing diagnostic waveforms. These waveforms help operators monitor the process and fine-tune the feedback mechanisms. This paper presents an overview of the board's architecture and its initial progress toward regulating beam extraction. This initial version of the regulation system aims to evaluate baseline performance to inform future system improvements.

Berlioz, J. R. [Fermilab]↗