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High cycle fatigue strength testing of gamma TiAl by the step test method is investigated. A design of experiments was implemented to determine if the coaxing effect occurred during testing. Since coaxing was not observed, step testing was deemed a suitable method to define the fatigue strength at 106 cycles.
INTRODUCTION Posture and locomotion are among the functions most affected by space flight. Postflight ataxia can be quantified easily by using the walk on the floor line test with the eyes closed (WOFEC). Data from a modified WOFEC were obtained as part of an ongoing interdisciplinary pre- and postflight study (Functional Task Test, FTT) designed to evaluate both postflight functional performance of astronauts and related physiological changes. METHODS Five astronauts with flight durations of 12 to 16 days participated in this study. Performance measurements were obtained in 2 preflight sessions, on landing day, and 1, 6, and 30 days after landing. The WOFEC test consisted of walking with the feet placed heel to toe in tandem, arms folded across the chest and eyes closed, for 10 steps. A trial was initiated after the eyes were closed and the front foot was aligned with the rear foot. The performance metric was the average percentage of correct steps completed over 3 trials. A step was not counted as correct if the crewmember sidestepped, opened eyes, or paused for more than 3 seconds between steps. Step accuracy was scored independently by 3 examiners. RESULTS Immediately after landing subjects seemed to be unaware of their foot position relative to their body or the floor. The percentage of correct steps was significantly decreased on landing day. Partial recovery was observed the next day, and full recovery to baseline on the sixth day post landing. CONCLUSION These data clearly demonstrate the sensorimotor challenges facing crewmembers after they return from space flight. Although this simple test is intended to complement the FTT battery of tests, it has some stand-alone value as it provides investigators with a means to quantify vestibular ataxia as well as provide instant feedback on postural stability without the use of complex test equipment.
This report documents the results of an experimental program conducted on two advanced metallic alloy systems (Rene' 142 directionally solidified alloy (DS) and Rene' N6 single crystal alloy) and the characterization of two distinct internal state variable inelastic constitutive models. The long term objective of the study was to develop a computational life prediction methodology that can integrate the obtained material data. A specialized test matrix for characterizing advanced unified viscoplastic models was specified and conducted. This matrix included strain controlled tensile tests with intermittent relaxtion test with 2 hr hold times, constant stress creep tests, stepped creep tests, mixed creep and plasticity tests, cyclic temperature creep tests and tests in which temperature overloads were present to simulate actual operation conditions for validation of the models. The selected internal state variable models where shown to be capable of representing the material behavior exhibited by the experimental results; however the program ended prior to final validation of the models.
Wavelet thresholding (or shrinkage) attempts to remove the noises existing in the signals while preserving inherent pattern characteristics in the reconstruction of true signals. For data-denoising purpose, we present a new wavelet thresholding procedure which employs the step-down testing idea of identifying active contrasts in unreplicated fractional factorial experiments. The proposed method employs bootstrapping methods to a step-down test for thresholding wavelet coefficients. By introducing the concept of a false discovery error rate in testing wavelet coefficients, we shrink the wavelet coefficients with p -values higher than the error rate. The error rate controls the expected proportion of wrongly accepted coefficients among chosen wavelet coefficients. Bootstrap samples are used to approximate the p -value for computational efficiency. We also present some guidelines for selecting the values of hyper-parameters which affect the performance in the step-down thresholding procedure. Based on some common testing signals and an air-conditioner sounds example, the comparison of our proposed procedure with other thresholding methods in the literature is performed. The analytical results show that the proposed procedure has a potential in data-denoising and data-reduction in a variety of signal reconstruction applications.
The effect of power/temperature step stress when applied to the transistor JANTX2N2905A manufactured by Texas Instruments and Motorola is reported. A total of 48 samples from each manufacturer was submitted to the process outlined. In addition, two control sample units were maintained for verification of the electrical parametric testing. All test samples were subjected to the electrical tests outlined in Table 2 after completing the prior power/temperature step stress point.
Experimental tests were conducted on two stepping motors for application as reactor control-drum actuators. Various control-drum loads with frictional resistances ranging from approximately zero to 40 N-m and inertias ranging from zero to 0.424 kg-sq m were tested.
The effect of power/temperature step stress when applied to a variety of voltage regulating diodes manufactured by Texas Instruments and Siemens was investigated. Test requirements are described and results are tabulated. Failure modes are discussed.
The space technology experiments platform (STEP) integration was examined. Topics include: experiment design, fabrication, and assembly; experiment performance and environmental testing; STEP compatibility testing; STEP experiment integration; STS/payload requirements definition documentation.
The effect of power/temperature step stress when applied to the zener diode JANTX1N3031B manufactured by Siemens and Motorola is reported. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control sample units were maintained for verification of the electrical parametric testing.
The effect of power/temperature step stress when applied to a field effect transistor JANTX2N4856 manufactured by Texas Instruments and Teledyne was evaluated. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control units were maintained for verification of the electrical parametric testing.
The effect of power/temperature step stress when applied to the zener diode JANTX2N2989 manufactured by Siemens and General Semiconductor is reported. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control sample units were maintained for verification of the electrical parameteric testing.
The effect of power/temperature step stress when applied to the switching diode JANTX1N5618 manufactured by Semtech and Micro Semiconductor is reported. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control sample units were maintained for verification of the electrical parametric testing.
The effect of power/temperature step stress when applied to a variety the zener diode JANTX2N3016B manufactured by Siemens and Motorola is reported. A total of 48 samples from each manufacturer was submitted to the process. In addition, two control sample units were maintained for verification of the electrical parametric testing.
The effect of power/temperature step stress when applied to the transistor JANTX2N2484, manufactured by Raytheon and Teledyne was evaluated. Forty-eight samples from each manufacturer were divided equally (16 per group) into three groups and submitted to the processes outlined. In addition, two control sample units were maintained for verification of the electrical parametric testing.
The effect was investigated of power/temperature step stress when applied to the zener diode JANTX1N937B manufactured by Motorola and Siemens. Test results, and failure analyses are included.
During Phase A, the STEP Study Team identified three types of experiments that can be accommodated on the STEP satellite within the mission constraints and whose performance is orders of magnitude better than any present or planned future experiment of the same kind on the ground. The scientific objectives of the STEP mission are to: test the Equivalence Principle to one part in 10(exp 17), six orders of magnitude better than has been achieved on the ground; search for a new interaction between quantum-mechanical spin and ordinary matter with a sensitivity of the mass-spin coupling constant g(sub p)g(sub s) = 6 x 10(exp -34) at a range of 1 mm, which represents a seven order-of-magnitude improvement over comparable ground-based measurements; and determine the constant of gravity G with a precision of one part in 10(exp 6) and to test the validity of the inverse square law with the same precision, both two orders of magnitude better than has been achieved on the ground.
The effect was studied of power/temperature step stress when applied to the zener diode JANTX1N972B manufactured by Siemens and Motorola. The power/temperature stress tests are presented, and failure analyses are included.
The effect was studied of power/temperature step stress when applied to the switching diode JANTX1N5550 manufactured by Semtech and Micro Semiconductor. The power/temperature stress tests are presented, and failure analyses are included.